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机构 日期 题名 作者
國立交通大學 2014-12-08T15:24:03Z Electrical Characteristics of Nanoscale Multi-Fin Field Effect Transistors with Different Fin Aspect Ratio Cheng, Hui-Wen; Hwang, Chih-Hong; Li, Yiming
國立交通大學 2014-12-08T15:24:02Z Process- and Random-Dopant-Induced Characteristic Variability of SRAM with nano-CMOS and Bulk FinFET Devices Li, Tien-Yeh; Hwang, Chih-Hong; Li, Yiming
國立交通大學 2014-12-08T15:24:02Z Characteristics Variability of Novel Lateral Asymmetry Nano-MOSFETs due to Random Discrete Dopant Lee, Kou-Fu; Hwang, Chih-Hong; Li, Tien-Yeh; Li, Yiming
國立交通大學 2014-12-08T15:23:44Z Effect of Flash Lamp Annealing and Laser Spike Annealing on Random Dopant Fluctuation of 15-nm Metal-Oxide-Semiconductor Devices Cheng, Hui-Wen; Hwang, Chih-Hong; Chao, Ko-An; Li, Yiming
國立交通大學 2014-12-08T15:22:31Z Effect of Process Variation on 15-nm-Gate Stacked Multichannel Surrounding-Gate Field Effect Transistor Han, Ming-Hung; Cheng, Hui-Wen; Hwang, Chih-Hong; Li, Yiming
國立交通大學 2014-12-08T15:18:51Z Large-Scale Atomistic Circuit-Device Coupled Simulation of Discrete-Dopant-Induced Characteristic Fluctuation in Nano-CMOS Digital Circuits Li, Yiming; Hwang, Chih-Hong
國立交通大學 2014-12-08T15:17:22Z Process-variation- and random-dopants-induced threshold voltage fluctuations in nanoscale planar MOSFET and bulk FinFET devices Li, Yiming; Hwang, Chih-Hong; Cheng, Hui-Wen
國立交通大學 2014-12-08T15:15:13Z Discrete Dopant Induced Characteristic Fluctuations in 16nm Multiple-Gate SOI Devices Li, Yiming; Hwang, Chih-Hong; Huang, Hsuan-Ming; Yeh, Ta-Ching
國立交通大學 2014-12-08T15:13:32Z The impact of high-frequency characteristics induced by intrinsic parameter fluctuations in nano-MOSFET device and circuit Han, Ming-Hung; Li, Yiming; Hwang, Chih-Hong
國立交通大學 2014-12-08T15:13:30Z Discrete Dopant Induced Electrical and Thermal Fluctuation in Nanoscale SOI FinFET Li, Yiming; Hwang, Chih-Hong; Yu, Shao-Ming; Huang, Hsuan-Ming

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