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教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
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"hwang chih hong"的相關文件
顯示項目 21-30 / 44 (共5頁)
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| 國立交通大學 |
2014-12-08T15:13:29Z |
Effect of Single Grain Boundary Position on Surrounding-Gate Polysilicon Thin Film Transistors
|
Li, Yiming; Huang, Jung Y.; Lee, Bo-Shian; Hwang, Chih-Hong |
| 國立交通大學 |
2014-12-08T15:13:15Z |
Discrete-dopant-induced characteristic fluctuations in 16 nm multiple-gate silicon-on-insulator devices
|
Li, Yiming; Hwang, Chih-Hong |
| 國立交通大學 |
2014-12-08T15:13:07Z |
Statistical variability in FinFET devices with intrinsic parameter fluctuations
|
Hwang, Chih-Hong; Li, Yiming; Han, Ming-Hung |
| 國立交通大學 |
2014-12-08T15:13:01Z |
Effect of fin angle on electrical characteristics of nanoscale round-top-gate bulk FinFETs
|
Li, Yiming; Hwang, Chih-Hong |
| 國立交通大學 |
2014-12-08T15:11:11Z |
Numerical simulation of nanoscale multiple-gate devices including random impurity effect
|
Hwang, Chih-Hong; Li, Yiming |
| 國立交通大學 |
2014-12-08T15:10:44Z |
UV Illumination Technique for Leakage Current Reduction in a-Si:H Thin-Film Transistors
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Li, Yiming; Hwang, Chih-Hong; Chen, Chung-Le; Yan, Shuoting; Lou, Jen-Chung |
| 國立交通大學 |
2014-12-08T15:10:33Z |
High-Frequency Characteristic Fluctuations of Nano-MOSFET Circuit Induced by Random Dopants
|
Li, Yiming; Hwang, Chih-Hong |
| 國立交通大學 |
2014-12-08T15:10:16Z |
Three-dimensional simulation of random-dopant-induced threshold voltage fluctuation in nanoscale Fin-typed field effect transistors
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Li, Yiming; Hwang, Chih-Hong; Yu, Shao-Ming; Huang, Hsuan-Ming |
| 國立交通大學 |
2014-12-08T15:09:42Z |
DC baseband and high-frequency characteristics of a silicon nanowire field effect transistor circuit
|
Li, Yiming; Hwang, Chih-Hong |
| 國立交通大學 |
2014-12-08T15:09:31Z |
Discrete-Dopant-Induced Timing Fluctuation and Suppression in Nanoscale CMOS Circuit
|
Li, Yiming; Hwang, Chih-Hong; Li, Tien-Yeh |
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