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Showing items 206-210 of 210  (21 Page(s) Totally)
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Institution Date Title Author
國立臺灣大學 1986 The Effect of Postoxidation Cooling on Oxygen on the Interface Property of MOS Capacitors 胡振國; Chang, J. J.; 王維新; Hwu, Jenn-Gwo; Chang, J. J.; Wang, Way-Seen
國立臺灣大學 1986 Radiation Effects on the Oxide Properties of Silicon MOS Capacitor 胡振國; Lee, G. S.; Jeng, M. J.; 王維新; 李嗣涔; Hwu, Jenn-Gwo; Lee, G. S.; Jeng, M. J.; Wang, Way-Seen; Lee, Si-Chen
國立臺灣大學 1985 The Effect of Charge-Temperature Aging on n-MOSFET 胡振國; Lin, C. M.; 王維新; Hwu, Jenn-Gwo; Lin, C. M.; Wang, Way-Seen
國立臺灣大學 1983 The Forward Characterization of 50 Amperes Power Rectifier Chen, M. K.; Chiou, Y. L.; 林浩雄; 胡振國; Chen, M. K.; Chiou, Y. L.; Lin, Hao-Hsiung; Hwu, Jenn-Gwo
國立臺灣大學 1982 Breakdown Voltage of Junction Passivated Power Rectifier 林浩雄; Hwang, C. C.; 胡振國; Chiou, Y. L.; Lin, Hao-Hsiung; Hwang, C. C.; Hwu, Jenn-Gwo; Chiou, Y. L.

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