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"hwu jenn gwo"
Showing items 31-40 of 210 (21 Page(s) Totally)
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| 國立臺灣大學 |
2008 |
Lateral Nonuniformity Effects of Border Traps on the Characteristics of Metal–Oxide–Semiconductor Field-Effect Transistors Subjected to High-Field Stresses
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Tseng, Jen-Chou; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2008 |
Silicon Oxide Gate Dielectric on N-Type 4H-SiC Prepared by Low Thermal Budget Anodization Method
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Chuang, Kai-Chieh; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2007 |
Effects of electrostatic discharge high-field current impulse on oxide breakdown
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Tseng, Jen-Chou; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2007 |
Low temperature (<400 ?C) Al2O3 ultrathin gate dielectrics prepared by shadow evaporation of aluminum followed by nitric acid oxidation
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Chiang, Jung-Chin; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2007 |
Modeling and Characterization of Hydrogen Induced Charge Loss in Nitride Trapping Memory
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Yang, Yi-Lin; Chang, Chia-Hua; Shih, Yen-Hao; Hsieh, Kuang-Yeu; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2007 |
Oxide-trapped charges induced by electrostatic discharge impulse stress
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Tseng, Jen-Chou; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2007 |
Analysis of Constitution and Characteristics of Lateral Nonuniformity Effects of MOS Devices Using QM-based Terman Method
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Lin, Hao-Peng; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2007 |
Reliability of Low Temperature Processing Hafnium Oxide Gate Dielectrics Prepared by Cost-effective Nitric Acid Oxidation (NAO) Technique
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Chang, Chia-Hua; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2006 |
Enhancement in Ultrathin Oxide Growth by Thermal-Induced Tensile Stress
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Hung, Chien-Jui; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2006 |
Impact of Strain-Temperature Stress on Ultrathin Oxide
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Tung, Chia-Wei; Yang, Yi-Lin; Hwu, Jenn-Gwo |
Showing items 31-40 of 210 (21 Page(s) Totally)
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