| 國立臺灣大學 |
2004 |
Ultrathin aluminum oxide gate dielectric on N-type 4H-SiC prepared by low thermal budget nitric acid oxidation
|
Huang, Szu-Wei; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2004 |
Suboxide Characteristics in Ultrathin Oxides Grown under Novel Oxidation Processes
|
Lin, Yen-Po; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2004 |
Oxide Thickness Dependent Suboxide Width and Its Effect on Inversion Tunneling Current
|
Lin, Yen-Po; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2003 |
Thermal Stress at Wafer Contact Points in Rapid Thermal Processing Investigated by Repeated Spike Treatment before Oxidation
|
Hong, Chao-Chi; Chang, Chang-Yun; Lee, Chaung-Yuan; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2003 |
Thickness-Dependent Stress Effect in P-type Metal-Oxide-Semiconductor Structure Investigated by Substrate Injection Current
|
Hong, Chao-Chi; Liao, Wei-Jian; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2003 |
Stress Distribution on (100) Si Wafer Mapped by Novel I-V Analysis of MOS Tunneling Diodes
|
Hong, Chao-Chi; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2003 |
Electrical Characterization and Process Control of Cost Effective High-k Aluminum Oxide Gate Dielectrics Prepared by Anodization Followed by Furnace Annealing
|
Huang, Szu-Wei; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2003 |
Using Anodization to Oxidize Ultrathin Aluminum Film for High-k Gate Dielectric Application
|
Lin, Yen-Po; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2002-01 |
Reduction in Leakage Current of Low-Temperature Thin-Gate Oxide by Repeated Spike Oxidation Technique
|
Hong, Chao-Chi; Chang, Chang-Yun; Lee, Chaung-Yuan; Hwu, Jenn-Gwo |
| 臺大學術典藏 |
2002-01 |
Reduction in Leakage Current of Low-Temperature Thin-Gate Oxide by Repeated Spike Oxidation Technique
|
Hong, Chao-Chi; Chang, Chang-Yun; Lee, Chaung-Yuan; Hwu, Jenn-Gwo; Hong, Chao-Chi; Chang, Chang-Yun; Lee, Chaung-Yuan; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2002 |
Ultralow leakage characteristics of ultrathin gate oxides (~3 nm) prepared by anodization followed by high-temperature annealing
|
Ting, Chieh-Chih; Shih, Yen-Hao; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2002 |
Local Thinning-Induced Oxide Nonuniformity Effect on the Tunneling Current of Ultrathin Gate Oxide
|
Hong, Chao-Chi; Chen, Wei-Ren; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2002 |
Effect of Mechanical Stress on Characteristics of Silicon Thermal Oxides
|
Yen, Jui-Yuan; Huang, Chia-Hong; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2002 |
Improvement in Ultrathin Rapid Thermal Oxide Uniformity by the Control of Gas Flow
|
Hong, Chao-Chi; Yen, Yuh-Ren; Su, Jiann-Liang; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2002 |
Improvement of oxide thickness uniformity by high then low O2 pressure oxidation in rapid thermal processing
|
Hong, Chao-Chi; Chen, Jenn-Long; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2002 |
Enhanced thermally induced stress effect on an ultrathin gate oxide
|
Su, Jiann-Liang; Hong, Chao-Chi; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2002 |
Silicon Metal-Oxide-Semiconductor Solar Cells with Oxide Prepared by Room Temperature Anodization in Hydrofluosilicic Acid Solution
|
Chen, Chih-Hao; Hong, Chao-Chi; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2001-10 |
Novel ultra thin gate oxide growth technique by alternating current anodization
|
Hwu, Jenn-Gwo; Lee, Chuang-Yuan; Ting, Chieh-Chih; Chen, Wei-Len |
| 臺大學術典藏 |
2001-10 |
Novel ultra thin gate oxide growth technique by alternating current anodization
|
Hwu, Jenn-Gwo; Lee, Chuang-Yuan; Ting, Chieh-Chih; Chen, Wei-Len; Hwu, Jenn-Gwo; Lee, Chuang-Yuan; Ting, Chieh-Chih; Chen, Wei-Len |
| 國立臺灣大學 |
2001 |
Ultra-thin gate oxides prepared by alternating current anodization of silicon followed by rapid thermal anneal
|
Chen, Yung-Chieh; Lee, Chuang-Yuan; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2001 |
Stress Effect on the Kinetics of Silicon Thermal Oxidation
|
Yen, Jui-Yuan; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2001 |
Anomalous low-voltage tunneling current characteristics of ultrathin gate oxide (~2 nm) after high-field stress
|
Huang, Chia-Hong; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2001 |
An on-Chip Temperature Sensor by Utilizing a MOS Tunneling Diode
|
Shih, Yen-Hao; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2001 |
Improvement in oxide thickness uniformity by repeated spikeoxidation
|
Hong, Chao-Chi; Lee, Chuang-Yuan; Hsieh, Yuan-Long; Liu, Chean-Chung; Fong, I.-K.; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2001 |
Breakdown characteristics of ultrathin gate oxides (<4 nm) in metal–oxide–semiconductor structure subjected to substrate injection
|
Huang, Chia-Hong; Hwu, Jenn-Gwo |
