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"hwu jenn gwo"
Showing items 61-70 of 210 (21 Page(s) Totally)
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| 國立臺灣大學 |
2003 |
Stress Distribution on (100) Si Wafer Mapped by Novel I-V Analysis of MOS Tunneling Diodes
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Hong, Chao-Chi; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2003 |
Electrical Characterization and Process Control of Cost Effective High-k Aluminum Oxide Gate Dielectrics Prepared by Anodization Followed by Furnace Annealing
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Huang, Szu-Wei; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2003 |
Using Anodization to Oxidize Ultrathin Aluminum Film for High-k Gate Dielectric Application
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Lin, Yen-Po; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2002-01 |
Reduction in Leakage Current of Low-Temperature Thin-Gate Oxide by Repeated Spike Oxidation Technique
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Hong, Chao-Chi; Chang, Chang-Yun; Lee, Chaung-Yuan; Hwu, Jenn-Gwo |
| 臺大學術典藏 |
2002-01 |
Reduction in Leakage Current of Low-Temperature Thin-Gate Oxide by Repeated Spike Oxidation Technique
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Hong, Chao-Chi; Chang, Chang-Yun; Lee, Chaung-Yuan; Hwu, Jenn-Gwo; Hong, Chao-Chi; Chang, Chang-Yun; Lee, Chaung-Yuan; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2002 |
Ultralow leakage characteristics of ultrathin gate oxides (~3 nm) prepared by anodization followed by high-temperature annealing
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Ting, Chieh-Chih; Shih, Yen-Hao; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2002 |
Local Thinning-Induced Oxide Nonuniformity Effect on the Tunneling Current of Ultrathin Gate Oxide
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Hong, Chao-Chi; Chen, Wei-Ren; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2002 |
Effect of Mechanical Stress on Characteristics of Silicon Thermal Oxides
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Yen, Jui-Yuan; Huang, Chia-Hong; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2002 |
Improvement in Ultrathin Rapid Thermal Oxide Uniformity by the Control of Gas Flow
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Hong, Chao-Chi; Yen, Yuh-Ren; Su, Jiann-Liang; Hwu, Jenn-Gwo |
| 國立臺灣大學 |
2002 |
Improvement of oxide thickness uniformity by high then low O2 pressure oxidation in rapid thermal processing
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Hong, Chao-Chi; Chen, Jenn-Long; Hwu, Jenn-Gwo |
Showing items 61-70 of 210 (21 Page(s) Totally)
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