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Institution	Date	Title	Author
國立交通大學	2019-08-02T02:24:17Z	Chip-Level Characterization and RTN-Induced Error Mitigation beyond 20nm Floating Gate Flash Memory	Lin, T. W.; Ku, S. H.; Cheng, C. H.; Lee, C. W.; Ijen-Huang; Tsai, Wen-Jer; Lu, T. C.; Lu, W. P.; Chen, K. C.; Wang, Tahui; Lu, Chih-Yuan

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	English \| 正體中文 \| 简体中文 \| 总笔数 :2852366
	造访人次 : 44973366 在线人数 : 1464 教育部委托研究计画计画执行:国立台湾大学图书馆