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机构	日期	题名	作者
臺大學術典藏	2018-09-10T09:50:25Z	Modeling Advanced PD SOI CMOS Devices	J. B. Kuo; J. B. Kuo; JAMES-B KUO
臺大學術典藏	2018-09-10T09:50:25Z	Back-Gate Bias Effect of PD SOI NMOS Device Considering BJT	D. H. Lung;J. B. Kuo; D. H. Lung; J. B. Kuo; JAMES-B KUO
臺大學術典藏	2018-09-10T09:50:25Z	Back-Gate Bias Effect of PD SOI NMOS Device Considering BJT	D. H. Lung;J. B. Kuo; D. H. Lung; J. B. Kuo; JAMES-B KUO
臺大學術典藏	2018-09-10T09:50:25Z	Analytical Drain Current Model for Poly-Si Thin-Film Transistors Biased in Strong Inversion Considering Degradation of Tail States at Grain Boundary	L. L. Wang;J. B. Kuo;S. Zhang; L. L. Wang; J. B. Kuo; S. Zhang; JAMES-B KUO
臺大學術典藏	2018-09-10T09:50:25Z	Analytical Drain Current Model for Poly-Si Thin-Film Transistors Biased in Strong Inversion Considering Degradation of Tail States at Grain Boundary	L. L. Wang;J. B. Kuo;S. Zhang; L. L. Wang; J. B. Kuo; S. Zhang; JAMES-B KUO
臺大學術典藏	2018-09-10T09:24:49Z	Compact Modeling of SOI CMOS Devices	J. B. Kuo; J. B. Kuo; JAMES-B KUO
臺大學術典藏	2018-09-10T09:24:49Z	Compact Modeling of SOI CMOS Devices	J. B. Kuo; J. B. Kuo; JAMES-B KUO
臺大學術典藏	2018-09-10T09:24:49Z	Grain-Boundary Impact Ionization-Induced Current Hump Effects of Polysilicon TFTs	S. Zhang; JAMES-B KUO; J. B. Kuo; T. C. Liu;J. B. Kuo;S. Zhang; T. C. Liu
臺大學術典藏	2018-09-10T09:24:49Z	Grain-Boundary Impact Ionization-Induced Current Hump Effects of Polysilicon TFTs	S. Zhang; JAMES-B KUO; J. B. Kuo; T. C. Liu;J. B. Kuo;S. Zhang; T. C. Liu
臺大學術典藏	2018-09-10T09:24:49Z	Grain Boundary-Related Kink Effects of Poly-Si TFTs	T. C. Liu;J. B. Kuo; T. C. Liu; J. B. Kuo; JAMES-B KUO
臺大學術典藏	2018-09-10T09:24:49Z	Grain Boundary-Related Kink Effects of Poly-Si TFTs	T. C. Liu;J. B. Kuo; T. C. Liu; J. B. Kuo; JAMES-B KUO
臺大學術典藏	2018-09-10T09:24:49Z	Modeling Hot-Carrier-Induced Reliability of Poly-silicon Thin Film Transistors	L. L. Wang;J. B. Kuo;S. Zhang; L. L. Wang; J. B. Kuo; S. Zhang; JAMES-B KUO
臺大學術典藏	2018-09-10T09:24:49Z	Modeling Hot-Carrier-Induced Reliability of Poly-silicon Thin Film Transistors	L. L. Wang;J. B. Kuo;S. Zhang; L. L. Wang; J. B. Kuo; S. Zhang; JAMES-B KUO
臺大學術典藏	2018-09-10T09:24:48Z	Foating-Body Kink-Effect Related Parasitic Bipolar Transistor Behavior in Poly-Si TFT	T. C. Liu;J. B. Kuo;S. D. Zhang; T. C. Liu; J. B. Kuo; S. D. Zhang; JAMES-B KUO
臺大學術典藏	2018-09-10T09:24:48Z	Foating-Body Kink-Effect Related Parasitic Bipolar Transistor Behavior in Poly-Si TFT	T. C. Liu;J. B. Kuo;S. D. Zhang; T. C. Liu; J. B. Kuo; S. D. Zhang; JAMES-B KUO
臺大學術典藏	2018-09-10T09:24:48Z	Turn-off Transient Behavior of 40nm PD SOI NMOS Device Considering the Floating Body Effect	S. W. Fang; J. B. Kuo; D. Chen; C. S. Yeh; JAMES-B KUO
臺大學術典藏	2018-09-10T09:24:48Z	Floating-Body Kink Effect: Ply-Si TFT versus SOI CMOS	T. C. Liu;J. B. Kuo;S. D. Zhang; T. C. Liu; J. B. Kuo; S. D. Zhang; JAMES-B KUO
臺大學術典藏	2018-09-10T09:24:48Z	Floating-Body Kink Effect: Ply-Si TFT versus SOI CMOS	T. C. Liu;J. B. Kuo;S. D. Zhang; T. C. Liu; J. B. Kuo; S. D. Zhang; JAMES-B KUO
臺大學術典藏	2018-09-10T09:24:48Z	Design of Distortionless Interconnects via Main/auxiliary Structure with LC Line for High Speed On-chip Transmission	T. C. Liu;J. B. Kuo;S. D. Zhang; T. C. Liu; J. B. Kuo; S. D. Zhang; JAMES-B KUO
臺大學術典藏	2018-09-10T09:24:48Z	Design of Distortionless Interconnects via Main/auxiliary Structure with LC Line for High Speed On-chip Transmission	T. C. Liu;J. B. Kuo;S. D. Zhang; T. C. Liu; J. B. Kuo; S. D. Zhang; JAMES-B KUO
臺大學術典藏	2018-09-10T08:46:16Z	Modeling the Floating-Body-Effect-Related Transient Behavior of 40nm PD SOI NMOS Device via the SPICE Bipolar/MOS Model	S. W. Fang; J. B. Kuo; D. Chen; C. S. Yeh; JAMES-B KUO
臺大學術典藏	2018-09-10T08:46:16Z	A Novel Low-Voltage Silicon-On-Insulator (SOI) CMOS Complementary Pass-Transistor Logic (CPL) Circuit using Asymmetrical Dynamic Threshold Pass-Transistor (ADTPT) Technique	J. B. Kuo;B. T. Wang; J. B. Kuo; B. T. Wang; JAMES-B KUO
臺大學術典藏	2018-09-10T08:46:16Z	A Novel Low-Voltage Silicon-On-Insulator (SOI) CMOS Complementary Pass-Transistor Logic (CPL) Circuit using Asymmetrical Dynamic Threshold Pass-Transistor (ADTPT) Technique	J. B. Kuo;B. T. Wang; J. B. Kuo; B. T. Wang; JAMES-B KUO
臺大學術典藏	2018-09-10T08:46:16Z	A Charge-Sharing-Problem-Free 1.5V BiCMOS Dynamic Logic Gate Circuit	J. B. Kuo; J. B. Kuo; JAMES-B KUO
臺大學術典藏	2018-09-10T08:46:16Z	A Charge-Sharing-Problem-Free 1.5V BiCMOS Dynamic Logic Gate Circuit	J. B. Kuo; J. B. Kuo; JAMES-B KUO

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