臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

	English \| 正體中文 \| 简体中文 \| 总笔数 :0
	造访人次 : 50685468 在线人数 : 255 教育部委托研究计画计画执行:国立台湾大学图书馆

搜寻范围

进阶搜寻

登入

管理

臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

关于TAIR
	计画说明

浏览
	典藏机构
	作者
	题名
	日期
	统计图表
	机构即时统计
	学术趋势

消息
	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

著作权
	出版社及期刊政策查询
	TAIR著作权会议记录

相关连结
	機構典藏計畫網站
	ROAR
	OpenDOAR
	SHERPA
	OAIster
	JAIRO
	Ira
	DSPACE
	RWWR
	臺大學術典藏NTU Scholars

"j c m li"的相关文件

回到依作者浏览
依题名排序	依日期排序

显示项目 61-76 / 76 (共4页)
<< < 1 2 3 4 > >>
每页显示[10|25|50]项目

机构	日期	题名	作者
臺大學術典藏	2018-09-10T07:09:34Z	A Dual-rail Asynchronous Scan Chain Design and Its Implementation in TFT Technology	C. H. Cheng; J. C.M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:09:34Z	Transition Fault Diagnosis Using At-speed Scan Patterns with Multiple Capture Clocks	Shang-Feng Chao;J. C.-M. Li; Shang-Feng Chao; J. C.-M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:09:34Z	Transition Fault Diagnosis Using At-speed Scan Patterns with Multiple Capture Clocks	Shang-Feng Chao;J. C.-M. Li; Shang-Feng Chao; J. C.-M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:09:33Z	Simultaneous capture and shift power reduction test pattern generator for scan testing	CHIEN-MO LI; J. C.M. Li; H.T. Lin
臺大學術典藏	2018-09-10T07:09:32Z	Effective and Economic Phase Noise Testing for Single-Chip TV Tuners	J. C.-M. Li; P.-C. Lin; P.-C. Chiang; C.-M. Pan; C.W. Tseng; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:09:32Z	Survey of Scan Chain Diagnosis	Y. Huang;R Guo;W.T. Cheng;J. C.-M. Li; Y. Huang; R Guo; W.T. Cheng; J. C.-M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:09:32Z	Survey of Scan Chain Diagnosis	Y. Huang;R Guo;W.T. Cheng;J. C.-M. Li; Y. Huang; R Guo; W.T. Cheng; J. C.-M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T06:37:54Z	Column Parity Row Selection (CPRS) BIST Diagnosis Technique: Modeling and Analysis	J. C.-M. Li; Hung-Mao Lin; Fang Min Wang; CHIEN-MO LI
臺大學術典藏	2018-09-10T06:37:54Z	Cyclic-CPRS : A Diagnosis Technique for BISTed Circuits for Nano-meter Technologies	C.Y. Lee; H.M. Lin; F.M. Wang; J. C. M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T06:03:19Z	Jump Simulation: A Fast and Precise Scan Chain Diagnosis Technique	Y. L Kao; W. S. Chuang; J. C. M Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T06:03:18Z	CRC BIST: A Low Peak Power Self Technique	Bo-Hua Chen; J. C.-M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T05:29:22Z	Jump Scan: A DFT Technique for Low Power Testing,	M.H. Chiu; J. C. M Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T05:29:21Z	Effective and Economic Phase Noise Testing for Single Chip TV Tuners	P.C. Lin; J. C.-M. Li; Chih-Ming Chiang; Chuo-Jan Pan; CHIEN-MO LI
臺大學術典藏	2018-09-10T04:59:51Z	ELF-Murphy Data on Defects and Test Sets	E. J. McCluskey; A. Alyamani; J. C. M. Li; C. W. Tseng; E. Volkerink; F. F. Feriani; E. Li; S. Mitra; CHIEN-MO LI
臺大學術典藏	2011-01	Row-linear feedback shift register-column x-masking technique for simultaneous testing of many-core system chips	W.C. Wang; J.C.M Li; CHIEN-MO LI
臺大學術典藏	2005-10	Column Parity and Row Select (CPRS): BIST Diagnosis for Errors in Multiple Scan Chains	CHIEN-MO LI; H.M. Lin; J. C. M. Li

显示项目 61-76 / 76 (共4页)
<< < 1 2 3 4 > >>
每页显示[10|25|50]项目