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Institution Date Title Author
臺大學術典藏 2019-10-24T08:24:32Z PSN-aware Circuit Test Timing Prediction using Machine Learning CHIEN-MO LI;J. C.M. Li;B. Liu; B. Liu; J. C.M. Li; CHIEN-MO LI
臺大學術典藏 2019-10-24T08:24:32Z PSN-aware Circuit Test Timing Prediction using Machine Learning CHIEN-MO LI;J. C.M. Li;B. Liu; B. Liu; J. C.M. Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T15:00:42Z Flexible TFT Circuit Analyzer Considering Process Variation, Aging, and Bending Effects E. H. Ma;W. E. Wei;H. Y. Li;J. C. M. Li;I. C. Cheng;Y. H. Yeh; E. H. Ma; W. E. Wei; H. Y. Li; J. C. M. Li; I. C. Cheng; Y. H. Yeh; I-CHUN CHENG; CHIEN-MO LI
臺大學術典藏 2018-09-10T15:00:42Z Flexible TFT Circuit Analyzer Considering Process Variation, Aging, and Bending Effects E. H. Ma;W. E. Wei;H. Y. Li;J. C. M. Li;I. C. Cheng;Y. H. Yeh; E. H. Ma; W. E. Wei; H. Y. Li; J. C. M. Li; I. C. Cheng; Y. H. Yeh; I-CHUN CHENG; CHIEN-MO LI
臺大學術典藏 2018-09-10T15:00:42Z Physical-aware Systematic Multiple Defect Diagnosis P. J. Chen;C. C. Che;J. C. M. Li;S. F. Kuo;P. Y. Hsueh;C. Y. Kuo;J. N. Lee; P. J. Chen; C. C. Che; J. C. M. Li; S. F. Kuo; P. Y. Hsueh; C. Y. Kuo; J. N. Lee; CHIEN-MO LI
臺大學術典藏 2018-09-10T15:00:42Z Physical-aware Systematic Multiple Defect Diagnosis P. J. Chen;C. C. Che;J. C. M. Li;S. F. Kuo;P. Y. Hsueh;C. Y. Kuo;J. N. Lee; P. J. Chen; C. C. Che; J. C. M. Li; S. F. Kuo; P. Y. Hsueh; C. Y. Kuo; J. N. Lee; CHIEN-MO LI
臺大學術典藏 2018-09-10T15:00:42Z Detect RRAM Defects in The Early Stage During Rnv8T Nonvolatile SRAM Testing B.C. Bai;C.A. Chen;J C.M Li; B.C. Bai; C.A. Chen; J C.M Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T15:00:42Z Detect RRAM Defects in The Early Stage During Rnv8T Nonvolatile SRAM Testing B.C. Bai;C.A. Chen;J C.M Li; B.C. Bai; C.A. Chen; J C.M Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T15:00:42Z Power-Supply-Noise-Aware Dynamic Timing Analyzer for 3D IC H.Y. Hsieh;J. C.-M. Li; H.Y. Hsieh; J. C.-M. Li; CHIEN-MO LI
臺大學術典藏 2018-09-10T15:00:42Z Power-Supply-Noise-Aware Dynamic Timing Analyzer for 3D IC H.Y. Hsieh;J. C.-M. Li; H.Y. Hsieh; J. C.-M. Li; CHIEN-MO LI

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