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機構	日期	題名	作者
臺大學術典藏	2018-09-10T07:43:06Z	Time-space test response compaction and diagnosis based on BCH codes	F. M. Wang;W.-C. Wang;J. C-M. Li; F. M. Wang; W.-C. Wang; J. C-M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:43:06Z	Bridging Fault Diagnosis to Identify the Layer of Systematic Defects	B. R. Chen;J. C.M. Li; B. R. Chen; J. C.M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:43:06Z	Bridging Fault Diagnosis to Identify the Layer of Systematic Defects	B. R. Chen;J. C.M. Li; B. R. Chen; J. C.M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:09:34Z	Phase Noise Testing of Single Chip TV Tuners,	P.-C. Lin; C.-H. Hsu; J. C.-M. Li; C.-M. Chiang; C.-J. Pan,; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:09:34Z	An Asynchronous DFT Technique for TFT Macroelectronics	C. H. Cheng; C.-H. Hsu; J. C.M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:09:34Z	A Dual-rail Asynchronous Scan Chain Design and Its Implementation in TFT Technology	C. H. Cheng; J. C.M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:09:34Z	Transition Fault Diagnosis Using At-speed Scan Patterns with Multiple Capture Clocks	Shang-Feng Chao;J. C.-M. Li; Shang-Feng Chao; J. C.-M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:09:34Z	Transition Fault Diagnosis Using At-speed Scan Patterns with Multiple Capture Clocks	Shang-Feng Chao;J. C.-M. Li; Shang-Feng Chao; J. C.-M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:09:33Z	Simultaneous capture and shift power reduction test pattern generator for scan testing	CHIEN-MO LI; J. C.M. Li; H.T. Lin
臺大學術典藏	2018-09-10T07:09:32Z	Effective and Economic Phase Noise Testing for Single-Chip TV Tuners	J. C.-M. Li; P.-C. Lin; P.-C. Chiang; C.-M. Pan; C.W. Tseng; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:09:32Z	Survey of Scan Chain Diagnosis	Y. Huang;R Guo;W.T. Cheng;J. C.-M. Li; Y. Huang; R Guo; W.T. Cheng; J. C.-M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:09:32Z	Survey of Scan Chain Diagnosis	Y. Huang;R Guo;W.T. Cheng;J. C.-M. Li; Y. Huang; R Guo; W.T. Cheng; J. C.-M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T06:37:54Z	Column Parity Row Selection (CPRS) BIST Diagnosis Technique: Modeling and Analysis	J. C.-M. Li; Hung-Mao Lin; Fang Min Wang; CHIEN-MO LI
臺大學術典藏	2018-09-10T06:37:54Z	Cyclic-CPRS : A Diagnosis Technique for BISTed Circuits for Nano-meter Technologies	C.Y. Lee; H.M. Lin; F.M. Wang; J. C. M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T06:03:19Z	Jump Simulation: A Fast and Precise Scan Chain Diagnosis Technique	Y. L Kao; W. S. Chuang; J. C. M Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T06:03:18Z	CRC BIST: A Low Peak Power Self Technique	Bo-Hua Chen; J. C.-M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T05:29:22Z	Jump Scan: A DFT Technique for Low Power Testing,	M.H. Chiu; J. C. M Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T05:29:21Z	Effective and Economic Phase Noise Testing for Single Chip TV Tuners	P.C. Lin; J. C.-M. Li; Chih-Ming Chiang; Chuo-Jan Pan; CHIEN-MO LI
臺大學術典藏	2018-09-10T04:59:51Z	ELF-Murphy Data on Defects and Test Sets	E. J. McCluskey; A. Alyamani; J. C. M. Li; C. W. Tseng; E. Volkerink; F. F. Feriani; E. Li; S. Mitra; CHIEN-MO LI
臺大學術典藏	2011-01	Row-linear feedback shift register-column x-masking technique for simultaneous testing of many-core system chips	W.C. Wang; J.C.M Li; CHIEN-MO LI
臺大學術典藏	2005-10	Column Parity and Row Select (CPRS): BIST Diagnosis for Errors in Multiple Scan Chains	CHIEN-MO LI; H.M. Lin; J. C. M. Li

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