臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
臺大學術典藏	2018-09-10T07:09:32Z	Survey of Scan Chain Diagnosis	Y. Huang;R Guo;W.T. Cheng;J. C.-M. Li; Y. Huang; R Guo; W.T. Cheng; J. C.-M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T07:09:32Z	Survey of Scan Chain Diagnosis	Y. Huang;R Guo;W.T. Cheng;J. C.-M. Li; Y. Huang; R Guo; W.T. Cheng; J. C.-M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T06:37:54Z	Column Parity Row Selection (CPRS) BIST Diagnosis Technique: Modeling and Analysis	J. C.-M. Li; Hung-Mao Lin; Fang Min Wang; CHIEN-MO LI
臺大學術典藏	2018-09-10T06:37:54Z	Cyclic-CPRS : A Diagnosis Technique for BISTed Circuits for Nano-meter Technologies	C.Y. Lee; H.M. Lin; F.M. Wang; J. C. M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T06:03:19Z	Jump Simulation: A Fast and Precise Scan Chain Diagnosis Technique	Y. L Kao; W. S. Chuang; J. C. M Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T06:03:18Z	CRC BIST: A Low Peak Power Self Technique	Bo-Hua Chen; J. C.-M. Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T05:29:22Z	Jump Scan: A DFT Technique for Low Power Testing,	M.H. Chiu; J. C. M Li; CHIEN-MO LI
臺大學術典藏	2018-09-10T05:29:21Z	Effective and Economic Phase Noise Testing for Single Chip TV Tuners	P.C. Lin; J. C.-M. Li; Chih-Ming Chiang; Chuo-Jan Pan; CHIEN-MO LI
臺大學術典藏	2018-09-10T04:59:51Z	ELF-Murphy Data on Defects and Test Sets	E. J. McCluskey; A. Alyamani; J. C. M. Li; C. W. Tseng; E. Volkerink; F. F. Feriani; E. Li; S. Mitra; CHIEN-MO LI
臺大學術典藏	2011-01	Row-linear feedback shift register-column x-masking technique for simultaneous testing of many-core system chips	W.C. Wang; J.C.M Li; CHIEN-MO LI
臺大學術典藏	2005-10	Column Parity and Row Select (CPRS): BIST Diagnosis for Errors in Multiple Scan Chains	CHIEN-MO LI; H.M. Lin; J. C. M. Li

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