臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
臺大學術典藏	2018-09-10T09:50:54Z	Compact Test Pattern Selection for Small Delay Defect	J. Y. Chang;K. Y. Liao;S. C. Hsu;J. C. M. Li;J. C. Rau; J. Y. Chang; K. Y. Liao; S. C. Hsu; J. C. M. Li; J. C. Rau; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:50:54Z	Compact Test Pattern Selection for Small Delay Defect	J. Y. Chang;K. Y. Liao;S. C. Hsu;J. C. M. Li;J. C. Rau; J. Y. Chang; K. Y. Liao; S. C. Hsu; J. C. M. Li; J. C. Rau; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:25:31Z	Thermal-aware Test Schedule and TAM Co-Optimization for Three Dimensional IC	C. J. Shih;C. Y. Hsu;C. Y. Kou;J. C. M. Li;J. C. Rau;K. Chakrabarty; C. J. Shih; C. Y. Hsu; C. Y. Kou; J. C. M. Li; J. C. Rau; K. Chakrabarty; CHIEN-MO LI
臺大學術典藏	2018-09-10T09:25:31Z	Thermal-aware Test Schedule and TAM Co-Optimization for Three Dimensional IC	C. J. Shih;C. Y. Hsu;C. Y. Kou;J. C. M. Li;J. C. Rau;K. Chakrabarty; C. J. Shih; C. Y. Hsu; C. Y. Kou; J. C. M. Li; J. C. Rau; K. Chakrabarty; CHIEN-MO LI

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