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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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2019臺灣學術機構典藏
研討會
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Institution Date Title Author
臺大學術典藏 2018-09-10T09:50:40Z A magnetic-field resonant probe with enhanced sensitivity for RF interference applications TZONG-LIN WU; J. Fan; T.-L. Wu; D. Pommerenke; Y.-J. Zhang; H.-H. Chuang;G.-H. Li;E. Song;H.-H. Park;H.-T. Jang;H.-B. Park;Y.-J. Zhang;D. Pommerenke;T.-L. Wu;J. Fan; H.-H. Chuang; G.-H. Li; E. Song; H.-H. Park; H.-T. Jang; H.-B. Park
臺大學術典藏 2018-09-10T09:50:40Z A magnetic-field resonant probe with enhanced sensitivity for RF interference applications TZONG-LIN WU; J. Fan; T.-L. Wu; D. Pommerenke; Y.-J. Zhang; H.-H. Chuang;G.-H. Li;E. Song;H.-H. Park;H.-T. Jang;H.-B. Park;Y.-J. Zhang;D. Pommerenke;T.-L. Wu;J. Fan; H.-H. Chuang; G.-H. Li; E. Song; H.-H. Park; H.-T. Jang; H.-B. Park
臺大學術典藏 2018-09-10T08:18:40Z Mitigation of noise coupling in multilayer high-speed PCB: state of the art modeling methodology and EBG technology T.-L. Wu;J. Fan;F. d. Paulis;C.-D. Wang;A. C. Scogna;A. Orl;i; T.-L. Wu; J. Fan; F. d. Paulis; C.-D. Wang; A. C. Scogna; A. Orl; i; Wu, Tzong-Lin
臺大學術典藏 2018-09-10T08:18:40Z Mitigation of noise coupling in multilayer high-speed PCB: state of the art modeling methodology and EBG technology T.-L. Wu;J. Fan;F. d. Paulis;C.-D. Wang;A. C. Scogna;A. Orl;i; T.-L. Wu; J. Fan; F. d. Paulis; C.-D. Wang; A. C. Scogna; A. Orl; i; Wu, Tzong-Lin
臺大學術典藏 2018-09-10T06:39:00Z An Integrated Wafer Acceptance Test Scheme in Semiconductor Manufacturing RUEY-SHAN GUO;C. Tsai;J. Fan,;S. Chang; RUEY-SHAN GUO; C. Tsai; J. Fan,; S. Chang; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T06:39:00Z An Integrated Wafer Acceptance Test Scheme in Semiconductor Manufacturing RUEY-SHAN GUO;C. Tsai;J. Fan,;S. Chang; RUEY-SHAN GUO; C. Tsai; J. Fan,; S. Chang; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T06:35:05Z Width-Optimal Visibility Representation of Plane Graphs J.. Fan; C. Lin; H.. Lu; H. Yen; HSU-CHUN YEN
臺大學術典藏 2018-09-10T06:04:18Z End-of-line Quality Control and Abnormal Trend Detection for IC Fabrication RUEY-SHAN GUO;J. Lee;S. Chang;J. Fan; RUEY-SHAN GUO; J. Lee; S. Chang; J. Fan; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T06:04:18Z End-of-line Quality Control and Abnormal Trend Detection for IC Fabrication RUEY-SHAN GUO;J. Lee;S. Chang;J. Fan; RUEY-SHAN GUO; J. Lee; S. Chang; J. Fan; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T06:04:18Z Abnormal Trend Detection of End-of-line Data Using EWMA Chart RUEY-SHAN GUO;J. Lee;S. Chang;R. Guo;J. Fan; RUEY-SHAN GUO; J. Lee; S. Chang; R. Guo; J. Fan; RUEY-SHAN GUO
臺大學術典藏 2018-09-10T06:04:18Z Abnormal Trend Detection of End-of-line Data Using EWMA Chart RUEY-SHAN GUO;J. Lee;S. Chang;R. Guo;J. Fan; RUEY-SHAN GUO; J. Lee; S. Chang; R. Guo; J. Fan; RUEY-SHAN GUO

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