臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
國立高雄師範大學	2008-09	Effect of Strain-Temperature Stress on MOS Structure with Ultra-thin Gate Oxide	C.N. Lin;Y.L. Yang;W.T. Chen;S.C. Lin;K.C. Chuang;J.G. Hwu; 楊宜霖
國立臺灣大學	2008-03	Study of Ultra-thin Gate Oxides Prepared by Tensile-Stress Oxidation in Tilted Cathode Anodization System	C.C.Wang, T.H.Li, K.C.Chuang; J.G.Hwu*
國立高雄師範大學	2007-12	Investigation of Strain-Temperature Stress Effects on the Characteristics of MOS Capacitors with Ultra-thin Gate Oxides	C.N. Lin;Y.L. Yang;W.T. Chen;S.C. Lin;J.G. Hwu; 楊宜霖
國立高雄師範大學	2007-06	Modeling and Characterization of Hydrogen Induced Charge Loss in Nitride Trapping Memory	Y.L. Yang;C.H. Chang;Y.H. Shih;K.Y. Hsieh;J.G. Hwu; 楊宜霖
國立高雄師範大學	2006-12	Hydrogen Eraser for Tightening VT Distribution of Nitride Trapping Memory	Y.L. Yang;C.H. Chang;Y.H. Shih;K.Y. Hsieh;J.G. Hwu; 楊宜霖
國立高雄師範大學	2004-10	Quality Improvement of Ultra-Thin Gate Oxide by Using Thermal-Growth Followed by Scanning-Frequency Anodization (SF ANO) Technique	Y.L. Yang;J.G. Hwu; 楊宜霖
國立高雄師範大學	2004-09	Growth-Then-Anodization Technique for Reliable Ultra-Thin Gate Oxides	W.J. Liao;Y.L. Yang;S.C. Chuang;J.G. Hwu; 楊宜霖

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