臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
臺大學術典藏	2022-05-24T06:26:52Z	Abbe error-free test equipment for nanometer-order measurements	Wang Y.C.;Manske E.;J?ger G.;Jywe W.Y.; Wang Y.C.; Manske E.; J?ger G.; Jywe W.Y.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:52Z	Abbe error-free test equipment for nanometer-order measurements	Wang Y.C.;Manske E.;J?ger G.;Jywe W.Y.; Wang Y.C.; Manske E.; J?ger G.; Jywe W.Y.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:42Z	The Application of the Dual-Beam Laser Interferometer for Calibration Precision Machine Tools	Liu C.-H.;Jywe W.-Y.;Chen I.-C.;Duan L.-L.;Jwo H.-H.;Jeng Y.-R.;Hsu T.-H.;Teng Y.-F.;Huang H.-L.;Wang M.-S.;J?ger G.; Liu C.-H.; Jywe W.-Y.; Chen I.-C.; Duan L.-L.; Jwo H.-H.; Jeng Y.-R.; Hsu T.-H.; Teng Y.-F.; Huang H.-L.; Wang M.-S.; J?ger G.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:42Z	The Application of the Dual-Beam Laser Interferometer for Calibration Precision Machine Tools	Liu C.-H.;Jywe W.-Y.;Chen I.-C.;Duan L.-L.;Jwo H.-H.;Jeng Y.-R.;Hsu T.-H.;Teng Y.-F.;Huang H.-L.;Wang M.-S.;J?ger G.; Liu C.-H.; Jywe W.-Y.; Chen I.-C.; Duan L.-L.; Jwo H.-H.; Jeng Y.-R.; Hsu T.-H.; Teng Y.-F.; Huang H.-L.; Wang M.-S.; J?ger G.; Wen-Yuh Jywe

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