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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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臺大學術典藏 2021-12-30T03:02:04Z Applications of positron annihilation, photoluminescence, and Raman spectroscopies to analyze the defect near the Si0.5Ge0.5/Si interface with super quality by diluted HF treatment C.-H. Chen; M.-H. Liao; K.-R. Lee; W.-S. Hong; K.-S. Liao; M.-C. Hung; W.-S. Wang; MING-HAN LIAO

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