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Institution Date Title Author
國立中山大學 2009-12 A 1.8 V to 3.3 V Level-Converting Flip-Flop Design for Multiple Power Supply Systems C.C. Wang;K.S.M. Li;S.J. Wang
國立中山大學 2009-11 Multiple Scan Trees Synthesis for Test Time/Data and Routing Length Reduction under Output Constraint K.S.M. Li;Y.C. Hung;J.Y. Huang
國立中山大學 2009-11 IEEE 1500 Compatible Multilevel Maximal Concurrent Interconnect Test K.S.M. Li;Y.Y. Liao;Y.W. Liu;J.Y. Huang
國立中山大學 2009-05 Scan-Chain Partition for High Test-Data Compressibility and Low Shift Power Under Routing Constraint S.J. Wang;K.S.M. Li;S.C. Chen;H.Y. Shiu;Y.L. Chu
國立中山大學 2009-05 Low Peak Power ATPG and Test Compaction for n-Detection Test K.S.M. Li;M.H. Hsieh;S.J. Wang
國立中山大學 2009-05 Scan-Chain Partition for High Test-Data Compressibility and Low Shift Power Under Routing Constraint S.J. Wang;K.S.M. Li;S.C. Chen;H.Y. Shiu;Y.L. Chu
國立中山大學 2009-02 A Unified Detection Scheme for Crosstalk Effects in Interconnection Bus K.S.M. Li;C.L. Lee;C. Su;J.E. Chen
國立中山大學 2009-02 A Unified Detection Scheme for Crosstalk Effects in Interconnection Bus K.S.M. Li;C.L. Lee;C. Su;J.E. Chen
國立中山大學 2009-01 Temperature-Aware Dynamic Frequency and Voltage Scaling for Reliability and Yield Enhancement Y.W. Yang;K.S.M. Li
國立中山大學 2009 Static and Dynamic Test Power Reduction in Scan-Based Testing S.J. Wang;S.J. Huang;K.S.M. Li

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