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| 國立成功大學 |
2016-03-23 |
Light-bias coupling erase process for non-volatile zinc tin oxide TFT memory with a nickel nanocrystals charge trap layer
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Li, Jeng-Ting; Liu, Li-Chih; Ke, Po-Hsien; Chen, Jen-Sue; Jeng, Jiann-Shing |
| 國立成功大學 |
2016-03 |
Charge Storage and Variable Temperature Data Retention Characteristics of Nitrided Titanium Oxide Nonvolatile Memory Device
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Ke, Po-Hsien; Li, Jeng-Ting; Hou, Guan-Ting; Chen, Jen-Sue |
| 國立成功大學 |
2014-08-06 |
氮化二氧化鈦作為電荷捕捉層在非揮發性記憶體中之研討
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柯伯賢; Ke, Po-Hsien |
| 國立成功大學 |
2014-06-26 |
氮化二氧化鈦作為電荷捕捉層在非揮發性記憶體中之研討
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柯伯賢; Ke, Po-Hsien |
Showing items 1-4 of 4 (1 Page(s) Totally)
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