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"kim young dong"
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| 國立交通大學 |
2014-12-08T15:12:23Z |
Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling
|
Hsu, Shih-Hsin; Liu, En-Shao; Chang, Yia-Chung; Hilfiker, James N.; Kim, Young Dong; Kim, Tae Jung; Lin, Chun-Jung; Lin, Gong-Ru |
| 國立臺灣大學 |
2008-04 |
Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling
|
Hsu, Shih-Hsin; Liu, En-Shao; Chang, Yia-Chung; Hilfiker, James N.; Kim, Young Dong; Kim, Tae Jung; Lin, Chun-Jung; Lin, Gong-Ru |
| 國立臺灣大學 |
2008 |
Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling
|
Hsu, Shih-Hsin; Liu, En-Shao; Chang, Yia-Chung; Hilfiker, James N.; Kim, Young Dong; Kim, Tae Jung; Lin, Chun-Jung; Lin, Gong-Ru |
Showing items 1-3 of 3 (1 Page(s) Totally)
1
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