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教育部委托研究计画 计画执行:国立台湾大学图书馆
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"kim young dong"的相关文件
显示项目 1-3 / 3 (共1页)
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| 國立交通大學 |
2014-12-08T15:12:23Z |
Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling
|
Hsu, Shih-Hsin; Liu, En-Shao; Chang, Yia-Chung; Hilfiker, James N.; Kim, Young Dong; Kim, Tae Jung; Lin, Chun-Jung; Lin, Gong-Ru |
| 國立臺灣大學 |
2008-04 |
Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling
|
Hsu, Shih-Hsin; Liu, En-Shao; Chang, Yia-Chung; Hilfiker, James N.; Kim, Young Dong; Kim, Tae Jung; Lin, Chun-Jung; Lin, Gong-Ru |
| 國立臺灣大學 |
2008 |
Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling
|
Hsu, Shih-Hsin; Liu, En-Shao; Chang, Yia-Chung; Hilfiker, James N.; Kim, Young Dong; Kim, Tae Jung; Lin, Chun-Jung; Lin, Gong-Ru |
显示项目 1-3 / 3 (共1页)
1
每页显示[10|25|50]项目
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