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"ko cheng ta"
Showing items 21-26 of 26 (3 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:29:51Z |
Backside-Process-Induced Junction Leakage and Process Improvement of Cu TSV Based on Cu/Sn and BCB Hybrid Bonding
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Chang, Yao-Jen; Ko, Cheng-Ta; Yu, Tsung-Han; Chiang, Cheng-Hao; Chen, Kuan-Neng |
| 國立交通大學 |
2014-12-08T15:29:39Z |
Reliability of key technologies in 3D integration
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Ko, Cheng-Ta; Chen, Kuan-Neng |
| 國立交通大學 |
2014-12-08T15:28:43Z |
Electrical and Reliability Investigation of Cu TSVs With Low-Temperature Cu/Sn and BCB Hybrid Bond Scheme
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Chang, Yao-Jen; Ko, Cheng-Ta; Chen, Kuan-Neng |
| 國立交通大學 |
2014-12-08T15:23:44Z |
Adhesive Selection and Bonding Parameter Optimization for Hybrid Bonding in 3D Integration
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Chen, Kuan-Neng; Ko, Cheng-Ta; Hsiao, Zhi-Cheng; Fu, Huan-Chun; Lo, Wei-Chung |
| 國立交通大學 |
2014-12-08T15:23:37Z |
A Wafer-Level Three-Dimensional Integration Scheme With Cu TSVs Based on Microbump/Adhesive Hybrid Bonding for Three-Dimensional Memory Application
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Ko, Cheng-Ta; Hsiao, Zhi-Cheng; Chang, Yao-Jen; Chen, Peng-Shu; Hwang, Yu-Jiau; Fu, Huan-Chun; Huang, Jui-Hsiung; Chiang, Chia-Wen; Sheu, Shyh-Shyuan; Chen, Yu-Hua; Lo, Wei-Chung; Chen, Kuan-Neng |
| 國立交通大學 |
2014-12-08T15:21:23Z |
Low temperature bonding technology for 3D integration
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Ko, Cheng-Ta; Chen, Kuan-Neng |
Showing items 21-26 of 26 (3 Page(s) Totally)
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