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机构 日期 题名 作者
國立交通大學 2014-12-08T15:46:15Z Characterization and modeling of out-diffusion of manganese and zinc impurities from deep ultraviolet photoresist Wang, MY; Ko, FH; Wang, TK; Yang, CC; Huang, TY
國立交通大學 2014-12-08T15:45:57Z Evaluation of metal migration and determination of trace metals after microwave digestion for lithographic materials Ko, FH; Wang, MY; Wang, TK
國立交通大學 2014-12-08T15:45:40Z Evaluation of cleaning efficiency with a radioactive tracer and development of a microwave digestion method for semiconductor processes Lu, JK; Ko, FH; Chu, TC; Sun, YC; Wang, MY; Wang, TK
國立交通大學 2014-12-08T15:44:48Z Migration-adsorption mechanism of metallic impurities out of chemically amplified photoresist onto silicon-based substrates Yang, CC; Ko, FH; Wang, MY; Wang, TK; Wu, SC
國立交通大學 2014-12-08T15:43:51Z Characterization and modeling of the metal diffusion from deep ultraviolet photoresist and silicon-based substrate Wang, TK; Wang, MY; Ko, FH; Tseng, CL
國立交通大學 2014-12-08T15:43:50Z One-step cleaning solution to replace the conventional RCA two-step cleaning recipe for pregate oxide cleaning Pan, TM; Lei, TF; Chao, TS; Liaw, MC; Ko, FH; Lu, CP
國立交通大學 2014-12-08T15:43:18Z Comparison of novel cleaning solutions, with various chelating agents for post-CMP cleaning on poly-Si film Pan, TM; Lei, TF; Ko, FH; Chao, TS; Chiu, TH; Lee, YH; Lu, CP
國立交通大學 2014-12-08T15:42:23Z Performance evaluation of cleaning solutions enhanced with tetraalkylammonium hydroxide substituents for post-CMP cleaning on poly-Si film Pan, TM; Lei, TF; Ko, FH; Chao, TS; Liaw, MC; Lee, YH; Lu, CP
國立交通大學 2014-12-08T15:40:48Z Mechanism and modeling of ring pattern formation for electron beam exposure on Zwitterresist Chen, JK; Ko, FH; Chen, HL; Chang, FC
國立交通大學 2014-12-08T15:39:00Z Fabrication of sub-60-nm contact holes in silicon dioxide layers Ko, FH; You, HC; Chu, TC; Lei, TF; Hsu, CC; Chen, HL

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