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Taiwan Academic Institutional Repository >
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"ko fu hsiang"
Showing items 231-240 of 251 (26 Page(s) Totally)
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| 國立成功大學 |
2009-01 |
Dustiness test of nanopowders using a standard rotating drum with a modified sampling train
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Tsai, Chuen-Jinn; Wu, Chien-Hsien; Leu, Ming-Long; Chen, Sheng-Chieh; Huang, Cheng-Yu; Tsai, Perng-Jy; Ko, Fu-Hsiang |
| 亞洲大學 |
2008 |
Nanocrystallization and interfacial tension of sol-gel derived memory
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Wu, Chi-Chang ; Tsai, Yi-Jen ; Chu, Min-Ching ; Yang, Shao-Ming ; Ko, Fu-Hsiang ; Liu, Pin-Lin; Yang, Wen-Luh ; You, Hsin-Chiang |
| 亞洲大學 |
2008 |
Stress-induced morphology and fine-line stability enhancement of NiSi on poly-SiGe with a buffer polycrystalline silicon interlayer
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Wu, Chi-Chang ; Wu, Wen-Fa ; Ko, Fu-Hsiang ; You, Hsin-Chiang ; Yang, Wen-Luh |
| 國立高雄第一科技大學 |
2007.08 |
The optical properties of monolayer amorphous Al2O3–TiO2 composite films used as HT-APSM blanks for ArF immersion lithography
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Laia, Fu-Der;C.Y.Huang;Ko, Fu-Hsiang |
| 國立成功大學 |
2007 |
Influence of the mask magnification on lithographic imaging in hyper NA lithography
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Lin, Chun-Hung; Chen, Hsuen-Li; Ko, Fu-Hsiang |
| 國立成功大學 |
2007 |
Self-Organized Tantalum Oxide Nanopyramidal Arrays for Antireflective Structure
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Wu, Chia-Tien; Ko, Fu-Hsiang; Lin, Chun-Hung |
| 國立成功大學 |
2007 |
Rigorous electromagnetic simulation of mask magnification effects on the diffracted light for EUV binary mask
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Lin, Chun-Hung; Chen, Hsuen-Li; Ko, Fu-Hsiang |
| 國立臺灣大學 |
2007 |
Rigorous electromagnetic simulation of mask magnification effects on the diffracted light for EUV binary mask
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Lin, Chun-Hung; Chen, Hsuen-Li; Ko, Fu-Hsiang |
| 國立臺灣大學 |
2007 |
Influence of the mask magnification on imaging in hyper-NA lithography
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Lin, Chun-Hung; Chen, Hsuen-Li; Ko, Fu-Hsiang |
| 臺大學術典藏 |
2007 |
Rigorous electromagnetic simulation of mask magnification effects on the diffracted light for EUV binary mask
|
Lin, Chun-Hung; Chen, Hsuen-Li; Ko, Fu-Hsiang; Lin, Chun-Hung; Chen, Hsuen-Li; Ko, Fu-Hsiang |
Showing items 231-240 of 251 (26 Page(s) Totally)
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