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Showing items 1-14 of 14 (1 Page(s) Totally)
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| 臺大學術典藏 |
2021-12-13T07:46:09Z |
A Swimming Robot Using Carbon Nanocoils
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Ku, S.H.; Liu, Tyng; Li, Z.D.; Hung, J.T.; Tsai, Y.S.; Chang, S.H.; TYNG LIU |
| 臺大學術典藏 |
2020-04-16T02:34:52Z |
CHT cloud orchestration: An integrated cloud system of virtualization platform
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Tu, C.-M.;Ku, S.-H.;Tseng, J.-C.;Kao, H.-T.;Lu, F.-S.;Lai, F.; Tu, C.-M.; Ku, S.-H.; Tseng, J.-C.; Kao, H.-T.; Lu, F.-S.; Lai, F.; FEI-PEI LAI |
| 國立交通大學 |
2020-02-02T23:55:33Z |
Hot-Carrier Injection-Induced Disturb and Improvement Methods in 3D NAND Flash Memory
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Lin, Wei-Liang; Tsai, Wen-Jer; Cheng, C. C.; Lu, Chun-Chang; Ku, S. H.; Chang, Y. W.; Wu, Guan-Wei; Liu, Lenvis; Hwang, S. W.; Lu, Tao-Cheng; Chen, Kuang-Chao; Tseng, Tseung-Yuen; Lu, Chih-Yuan |
| 國立交通大學 |
2019-08-02T02:24:17Z |
Chip-Level Characterization and RTN-Induced Error Mitigation beyond 20nm Floating Gate Flash Memory
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Lin, T. W.; Ku, S. H.; Cheng, C. H.; Lee, C. W.; Ijen-Huang; Tsai, Wen-Jer; Lu, T. C.; Lu, W. P.; Chen, K. C.; Wang, Tahui; Lu, Chih-Yuan |
| 國立交通大學 |
2019-05-02T00:25:50Z |
Grain Boundary Trap-Induced Current Transient in a 3-D NAND Flash Cell String
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Lin, Wei-Liang; Tsai, Wen-Jer; Cheng, C. C.; Ku, S. H.; Liu, Lenvis; Hwang, S. W.; Lu, Tao-Cheng; Chen, Kuang-Chao; Tseng, Tseung-Yuen; Lu, Chih-Yuan |
| 國立交通大學 |
2019-04-02T06:04:53Z |
Error Characterization and ECC Usage Relaxation beyond 20nm Floating Gate NAND Flash Memory
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Ku, S. H.; Lin, T. W.; Cheng, C. H.; Lee, C. W.; Chen, Ti-Wen; Tsai, Wen-Jer; Lu, T. C.; Lu, W. P.; Chen, K. C.; Wang, Tahui; Lu, Chih-Yuan |
| 國立交通大學 |
2019-04-02T06:04:37Z |
Analysis and Realization of TLC or even QLC Operation with a High Performance Multi-times Verify Scheme in 3D NAND Flash memory
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Lu, C. C.; Cheng, C. C.; Chiu, H. P.; Lin, W. L.; Chen, T. W.; Ku, S. H.; Tsai, Wen-Jer; Lu, T. C.; Chen, K. C.; Wang, Tahui; Lu, Chih-Yuan |
| 國立交通大學 |
2019-04-02T05:59:51Z |
Variations of V-t Retention Loss in a SONOS Flash Memory Due to a Current-Path Percolation Effect
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Chou, Y. L.; Chung, Y. T.; Wang, Tahui; Ku, S. H.; Zou, N. K.; Chen, Vincent; Lu, W. P.; Chen, K. C.; Lu, Chih-Yuan |
| 國立交通大學 |
2018-08-21T05:56:39Z |
Polycrystalline-Silicon Channel Trap Induced Transient Read Instability in a 3D NAND Flash Cell String
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Tsai, Wen-Jer; Lin, W. L.; Cheng, C. C.; Ku, S. H.; Chou, Y. L.; Liu, Lenvis; Hwang, S. W.; Lu, T. C.; Chen, K. C.; Wang, Tahui; Lu, Chih-Yuan |
| 國立交通大學 |
2014-12-08T15:21:21Z |
Program Charge Effect on Random Telegraph Noise Amplitude and Its Device Structural Dependence in SONOS Flash Memory
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Chiu, J. P.; Chou, Y. L.; Ma, H. C.; Wang, Tahui; Ku, S. H.; Zou, N. K.; Chen, Vincent; Lu, W. P.; Chen, K. C.; Lu, Chih-Yuan |
| 國立交通大學 |
2014-12-08T15:11:50Z |
Variations of V(t) Retention Loss in a SONOS Flash Memory Due to a Current-Path Percolation Effect
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Chou, Y. L.; Chung, Y. T.; Wang, Tahui; Ku, S. H.; Zou, N. K.; Chen, Vincent; Lu, W. P.; Chen, K. C.; Lu, Chih-Yuan |
| 國立交通大學 |
2014-12-08T15:08:23Z |
Program Trapped-Charge Effect on Random Telegraph-Noise Amplitude in a Planar SONOS Flash Memory Cell
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Ma, H. C.; Chou, Y. L.; Chiu, J. P.; Wang, Tahui; Ku, S. H.; Zou, N. K.; Chen, Vincent; Lu, W. P.; Chen, K. C.; Lu, Chih-Yuan |
| 大葉大學 |
2004-07 |
Development of functional transgenic tomato with hypotriglyceridemic action.
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Ku, S.-H.;Shieh, Y.-K.;Jin, J.-K.;Cheng, J.-C.;Yang, C.-F.;Hsu, W.-H.;Hung, S.-H.;Lin, C.-H. |
| 大葉大學 |
2004-07 |
Development of functional transgenic tomato with hypotriglyceridemic action
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Yu, C. W.;Ku, S. H.;Shieh, Y. K.;Jin, J. K.;Cheng, J. C.;Yang, C. F.;Hsu, W. H.;Lin, C. H. |
Showing items 1-14 of 14 (1 Page(s) Totally)
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