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Institution	Date	Title	Author
國立交通大學	2014-12-08T15:29:10Z	Metal-Gate/High-kappa/Ge nMOS at Small CET With Higher Mobility Than SiO2/Si at Wide Range Carrier Densities	Liao, C. C.; Ku, T. C.; Lin, M. H.; Zeng, Lang; Kang, Jinfeng; Liu, Xiaoyan; Chin, Albert

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