| 臺大學術典藏 |
2020-06-16T06:34:48Z |
Supplementary zones-surrounded fresnel zone plate
|
Lee, Y.-M.;Chen, S.-H.;Hsu, C.-P.;Chiou, P.-C.;Tsai, K.-Y.;Chung, T.-T.;Cheng-Han-Tsai, Liu, Z.-Y.;Li, J.-H.; Lee, Y.-M.; Chen, S.-H.; Hsu, C.-P.; Chiou, P.-C.; Tsai, K.-Y.; Chung, T.-T.; Cheng-Han-Tsai, Liu, Z.-Y.; Li, J.-H.; KUEN-YU TSAI |
| 臺大學術典藏 |
2020-06-16T06:34:48Z |
Non-delta-chrome optical proximity correction methodology for process models with three-dimensional mask effects (vol 10, 033010, 2011)
|
Ng, Philip C. W.;Tsai, Kuen-Yu;Melvin, Lawrence S.; Ng, Philip C. W.; Tsai, Kuen-Yu; Melvin, Lawrence S.; KUEN-YU TSAI |
| 臺大學術典藏 |
2020-06-16T06:34:48Z |
Design of automatic controllers for model-based OPC with optimal resist threshold determination for improving correction convergence
|
Su, Y.-S.;Ng, P.C.W.;Tsai, K.-Y.;Chen, Y.-Y.; Su, Y.-S.; Ng, P.C.W.; Tsai, K.-Y.; Chen, Y.-Y.; KUEN-YU TSAI |
| 臺大學術典藏 |
2020-06-16T06:34:48Z |
The electrostatic potential inside the electron-optical systen with periodic boundary-value conditions
|
Pei, T.-H.;Tsai, K.-Y.;Li, J.-H.; Pei, T.-H.; Tsai, K.-Y.; Li, J.-H.; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:05Z |
Investigation on MBOPC convergence improvement with location-dependent correction factors aided by machine learning
|
KUEN-YU TSAI;Matt St. John;James P. Shiely;Kuen-Yu Tsai*;Chien-Lin Lee;Sheng-Wei Chien;Jia-Syun Cai; Jia-Syun Cai; Sheng-Wei Chien; Chien-Lin Lee; Kuen-Yu Tsai*; James P. Shiely; Matt St. John; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:05Z |
Investigation on MBOPC convergence improvement with location-dependent correction factors aided by machine learning
|
KUEN-YU TSAI;Matt St. John;James P. Shiely;Kuen-Yu Tsai*;Chien-Lin Lee;Sheng-Wei Chien;Jia-Syun Cai; Jia-Syun Cai; Sheng-Wei Chien; Chien-Lin Lee; Kuen-Yu Tsai*; James P. Shiely; Matt St. John; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:05Z |
Investigation on MBOPC convergence improvement with location-dependent correction factors aided by machine learning
|
KUEN-YU TSAI;Matt St. John;James P. Shiely;Kuen-Yu Tsai*;Chien-Lin Lee;Sheng-Wei Chien;Jia-Syun Cai; Jia-Syun Cai; Sheng-Wei Chien; Chien-Lin Lee; Kuen-Yu Tsai*; James P. Shiely; Matt St. John; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:05Z |
Investigation on MBOPC convergence improvement with location-dependent correction factors aided by machine learning
|
KUEN-YU TSAI;Matt St. John;James P. Shiely;Kuen-Yu Tsai*;Chien-Lin Lee;Sheng-Wei Chien;Jia-Syun Cai; Jia-Syun Cai; Sheng-Wei Chien; Chien-Lin Lee; Kuen-Yu Tsai*; James P. Shiely; Matt St. John; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:05Z |
Accuracy improvement of electrical characteristics estimation for sub-20nm FDSOI devices with non-rectangular gates
|
KUEN-YU TSAI;Kuen-Yu Tsai*;Chien-Lin Lee;Xin-Yang Zheng;Sheng-Wei Chien;Jia-Syun Cai; Jia-Syun Cai; Sheng-Wei Chien; Xin-Yang Zheng; Chien-Lin Lee; Kuen-Yu Tsai*; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:05Z |
Accuracy improvement of electrical characteristics estimation for sub-20nm FDSOI devices with non-rectangular gates
|
KUEN-YU TSAI;Kuen-Yu Tsai*;Chien-Lin Lee;Xin-Yang Zheng;Sheng-Wei Chien;Jia-Syun Cai; Jia-Syun Cai; Sheng-Wei Chien; Xin-Yang Zheng; Chien-Lin Lee; Kuen-Yu Tsai*; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:05Z |
Accuracy improvement of electrical characteristics estimation for sub-20nm FDSOI devices with non-rectangular gates
|
KUEN-YU TSAI;Kuen-Yu Tsai*;Chien-Lin Lee;Xin-Yang Zheng;Sheng-Wei Chien;Jia-Syun Cai; Jia-Syun Cai; Sheng-Wei Chien; Xin-Yang Zheng; Chien-Lin Lee; Kuen-Yu Tsai*; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:05Z |
Accuracy improvement of electrical characteristics estimation for sub-20nm FDSOI devices with non-rectangular gates
|
KUEN-YU TSAI;Kuen-Yu Tsai*;Chien-Lin Lee;Xin-Yang Zheng;Sheng-Wei Chien;Jia-Syun Cai; Jia-Syun Cai; Sheng-Wei Chien; Xin-Yang Zheng; Chien-Lin Lee; Kuen-Yu Tsai*; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:04Z |
Simulation-based proximity effect correction for helium ion beam lithography
|
KUEN-YU TSAI;Kuen-Yu Tsai*;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Kuen-Yu Tsai*; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:04Z |
Simulation-based proximity effect correction for helium ion beam lithography
|
KUEN-YU TSAI;Kuen-Yu Tsai*;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Kuen-Yu Tsai*; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:04Z |
Simulation-based proximity effect correction for helium ion beam lithography
|
KUEN-YU TSAI;Kuen-Yu Tsai*;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Kuen-Yu Tsai*; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:04Z |
Simulation-based proximity effect correction for helium ion beam lithography
|
KUEN-YU TSAI;Kuen-Yu Tsai*;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Kuen-Yu Tsai*; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:03Z |
Model-based proximity effect correction for helium ion beam lithography
|
KUEN-YU TSAI;Kuen-Yu Tsai*;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Kuen-Yu Tsai*; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:03Z |
Model-based proximity effect correction for helium ion beam lithography
|
KUEN-YU TSAI;Kuen-Yu Tsai*;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Kuen-Yu Tsai*; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:03Z |
Model-based proximity effect correction for helium ion beam lithography
|
KUEN-YU TSAI;Kuen-Yu Tsai*;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Kuen-Yu Tsai*; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:03Z |
Model-based proximity effect correction for helium ion beam lithography
|
KUEN-YU TSAI;Kuen-Yu Tsai*;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Kuen-Yu Tsai*; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:01Z |
Fabrication of metrology test structures with helium ion beam direct write
|
KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai*;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai*; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:01Z |
Fabrication of metrology test structures with helium ion beam direct write
|
KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai*;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai*; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:01Z |
Fabrication of metrology test structures with helium ion beam direct write
|
KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai*;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai*; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:01Z |
Fabrication of metrology test structures with helium ion beam direct write
|
KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai*;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai*; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:00Z |
Fabrication of metrology test structures with helium ion beam direct write
|
KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai*;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai*; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:00Z |
Fabrication of metrology test structures with helium ion beam direct write
|
KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai*;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai*; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:00Z |
Fabrication of metrology test structures with helium ion beam direct write
|
KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai*;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai*; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:00Z |
Fabrication of metrology test structures with helium ion beam direct write
|
KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai*;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai*; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:57:58Z |
Fabrication of metrology test structures with programmed imperfection using helium ion beam direct write
|
KUEN-YU TSAI;Jia-Han Li;Kuen-Yu Tsai*;Sheng-Wei Chien; Sheng-Wei Chien; Kuen-Yu Tsai*; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:57:58Z |
Fabrication of metrology test structures with programmed imperfection using helium ion beam direct write
|
KUEN-YU TSAI;Jia-Han Li;Kuen-Yu Tsai*;Sheng-Wei Chien; Sheng-Wei Chien; Kuen-Yu Tsai*; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:57:58Z |
Fabrication of metrology test structures with programmed imperfection using helium ion beam direct write
|
KUEN-YU TSAI;Jia-Han Li;Kuen-Yu Tsai*;Sheng-Wei Chien; Sheng-Wei Chien; Kuen-Yu Tsai*; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:57:58Z |
Fabrication of metrology test structures with programmed imperfection using helium ion beam direct write
|
KUEN-YU TSAI;Jia-Han Li;Kuen-Yu Tsai*;Sheng-Wei Chien; Sheng-Wei Chien; Kuen-Yu Tsai*; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:36:26Z |
Method and System for Establishing Parametric Model
|
Kuen-Yu Tsai; Chun-Hung Liu; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:36:26Z |
Method and System for Establishing Parametric Model
|
Kuen-Yu Tsai; Chun-Hung Liu; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:26:03Z |
Design of an electron-optical system with a ball-tip emission source through a numerical optimization method for high-throughput electron-beam–direct-write lithography
|
Yu-Tian Shen; Kuen-Yu Tsai; KUEN-YU TSAI; Hsuan-Ping Lee;Sheng-Yung Chen;Chun-Hung Liu;Ding-Qi;Yu-Tian Shen;Kuen-Yu Tsai; Hsuan-Ping Lee; Sheng-Yung Chen; Chun-Hung Liu; Ding-Qi |
| 臺大學術典藏 |
2018-09-10T15:26:03Z |
Design of an electron-optical system with a ball-tip emission source through a numerical optimization method for high-throughput electron-beam–direct-write lithography
|
Yu-Tian Shen; Kuen-Yu Tsai; KUEN-YU TSAI; Hsuan-Ping Lee;Sheng-Yung Chen;Chun-Hung Liu;Ding-Qi;Yu-Tian Shen;Kuen-Yu Tsai; Hsuan-Ping Lee; Sheng-Yung Chen; Chun-Hung Liu; Ding-Qi |
| 臺大學術典藏 |
2018-09-10T15:26:03Z |
Design of an electron-optical system with a ball-tip emission source through a numerical optimization method for high-throughput electron-beam–direct-write lithography
|
Yu-Tian Shen; Kuen-Yu Tsai; KUEN-YU TSAI; Hsuan-Ping Lee;Sheng-Yung Chen;Chun-Hung Liu;Ding-Qi;Yu-Tian Shen;Kuen-Yu Tsai; Hsuan-Ping Lee; Sheng-Yung Chen; Chun-Hung Liu; Ding-Qi |
| 臺大學術典藏 |
2018-09-10T15:26:03Z |
Comparison of the vectorial diffraction theory and Fraunhofer approximation method on diffractive images of Fresnel zone plates
|
Ting-Hang Pei;Kuen-Yu Tsai;Jia-Han Li; Ting-Hang Pei; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:26:03Z |
Comparison of the vectorial diffraction theory and Fraunhofer approximation method on diffractive images of Fresnel zone plates
|
Ting-Hang Pei;Kuen-Yu Tsai;Jia-Han Li; Ting-Hang Pei; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:26:03Z |
Comparison of the vectorial diffraction theory and Fraunhofer approximation method on diffractive images of Fresnel zone plates
|
Ting-Hang Pei;Kuen-Yu Tsai;Jia-Han Li; Ting-Hang Pei; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:26:03Z |
Supplementary zones-surrounded Fresnel zone plate with enhanced optical resolution
|
Yen-Min Lee;Szu-Hung Chen;Chen-Pin Hsu;Pei-Chuen Chiou;Kuen-Yu Tsai;Tien-Tung Chung;Cheng-Han Tsai;Zhan-Yu Liu;Jia-Han Li; Yen-Min Lee; Szu-Hung Chen; Chen-Pin Hsu; Pei-Chuen Chiou; Kuen-Yu Tsai; Tien-Tung Chung; Cheng-Han Tsai; Zhan-Yu Liu; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:26:03Z |
Supplementary zones-surrounded Fresnel zone plate with enhanced optical resolution
|
Yen-Min Lee;Szu-Hung Chen;Chen-Pin Hsu;Pei-Chuen Chiou;Kuen-Yu Tsai;Tien-Tung Chung;Cheng-Han Tsai;Zhan-Yu Liu;Jia-Han Li; Yen-Min Lee; Szu-Hung Chen; Chen-Pin Hsu; Pei-Chuen Chiou; Kuen-Yu Tsai; Tien-Tung Chung; Cheng-Han Tsai; Zhan-Yu Liu; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:26:03Z |
Supplementary zones-surrounded Fresnel zone plate with enhanced optical resolution
|
Yen-Min Lee;Szu-Hung Chen;Chen-Pin Hsu;Pei-Chuen Chiou;Kuen-Yu Tsai;Tien-Tung Chung;Cheng-Han Tsai;Zhan-Yu Liu;Jia-Han Li; Yen-Min Lee; Szu-Hung Chen; Chen-Pin Hsu; Pei-Chuen Chiou; Kuen-Yu Tsai; Tien-Tung Chung; Cheng-Han Tsai; Zhan-Yu Liu; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:26:03Z |
Multilayer Mirror Structure (多層反射鏡結構)
|
Jia-Han Li;Yen-Min Lee;Kuen-Yu Tsai; Jia-Han Li; Yen-Min Lee; Kuen-Yu Tsai; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:26:03Z |
Multilayer Mirror Structure (多層反射鏡結構)
|
Jia-Han Li;Yen-Min Lee;Kuen-Yu Tsai; Jia-Han Li; Yen-Min Lee; Kuen-Yu Tsai; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:26:03Z |
Multilayer Mirror Structure (多層反射鏡結構)
|
Jia-Han Li;Yen-Min Lee;Kuen-Yu Tsai; Jia-Han Li; Yen-Min Lee; Kuen-Yu Tsai; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:00:25Z |
System and Method for Estimating Change of Status of Particle Beams (粒子束狀態改變監測系統及其方法)
|
Kuen-Yu Tsai;Sheng-Yung Chen;Jia-Yush Yen;Yung-Yaw Chen;Chi-Hsiang Fan; Kuen-Yu Tsai; Sheng-Yung Chen; Jia-Yush Yen; Yung-Yaw Chen; Chi-Hsiang Fan; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:00:25Z |
System and Method for Estimating Change of Status of Particle Beams (粒子束狀態改變監測系統及其方法)
|
Kuen-Yu Tsai;Sheng-Yung Chen;Jia-Yush Yen;Yung-Yaw Chen;Chi-Hsiang Fan; Kuen-Yu Tsai; Sheng-Yung Chen; Jia-Yush Yen; Yung-Yaw Chen; Chi-Hsiang Fan; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:00:25Z |
System and Method for Estimating Change of Status of Particle Beams (粒子束狀態改變監測系統及其方法)
|
Kuen-Yu Tsai;Sheng-Yung Chen;Jia-Yush Yen;Yung-Yaw Chen;Chi-Hsiang Fan; Kuen-Yu Tsai; Sheng-Yung Chen; Jia-Yush Yen; Yung-Yaw Chen; Chi-Hsiang Fan; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:00:24Z |
Refractive index and effective thickness measurement system for the RGB color filter coatings with absorption and scattering properties
|
Yen-Min Lee;Hsin-Hung Cheng;Jia-Han Li;Kuen-Yu Tsai;Yu-Tian Sheng; Yen-Min Lee; Hsin-Hung Cheng; Jia-Han Li; Kuen-Yu Tsai; Yu-Tian Sheng; KUEN-YU TSAI |
