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Showing items 266-313 of 313  (7 Page(s) Totally)
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Institution Date Title Author
臺大學術典藏 2018-09-10T07:08:40Z A new method to improve accuracy of leakage current estimation for transistors with non-rectangular gates due to sub-wavelength lithography effects Meng-Fu You; Yi-Chang Lu; Philip C. W. Ng; YI-CHANG LU; KUEN-YU TSAI; Kuen-Yu Tsai;Meng-Fu You;Yi-Chang Lu;Philip C. W. Ng; Kuen-Yu Tsai
臺大學術典藏 2018-09-10T07:08:40Z A new method to improve accuracy of leakage current estimation for transistors with non-rectangular gates due to sub-wavelength lithography effects Meng-Fu You; Yi-Chang Lu; Philip C. W. Ng; YI-CHANG LU; KUEN-YU TSAI; Kuen-Yu Tsai;Meng-Fu You;Yi-Chang Lu;Philip C. W. Ng; Kuen-Yu Tsai
臺大學術典藏 2018-09-10T07:08:40Z A new method to improve accuracy of leakage current estimation for transistors with non-rectangular gates due to sub-wavelength lithography effects Meng-Fu You; Yi-Chang Lu; Philip C. W. Ng; YI-CHANG LU; KUEN-YU TSAI; Kuen-Yu Tsai;Meng-Fu You;Yi-Chang Lu;Philip C. W. Ng; Kuen-Yu Tsai
臺大學術典藏 2018-09-10T07:08:40Z A novel curve-fitting procedure for determining proximity effect parameters in electron beam lithography Chun-Hung Liu;Hoi-Tou Ng;Philip C. W. Ng;Kuen-Yu Tsai;Shy-Jay Lin;Jeng-Horng Chen; Chun-Hung Liu; Hoi-Tou Ng; Philip C. W. Ng; Kuen-Yu Tsai; Shy-Jay Lin; Jeng-Horng Chen; KUEN-YU TSAI
臺大學術典藏 2018-09-10T07:08:40Z A novel curve-fitting procedure for determining proximity effect parameters in electron beam lithography Chun-Hung Liu;Hoi-Tou Ng;Philip C. W. Ng;Kuen-Yu Tsai;Shy-Jay Lin;Jeng-Horng Chen; Chun-Hung Liu; Hoi-Tou Ng; Philip C. W. Ng; Kuen-Yu Tsai; Shy-Jay Lin; Jeng-Horng Chen; KUEN-YU TSAI
臺大學術典藏 2018-09-10T07:08:40Z A novel curve-fitting procedure for determining proximity effect parameters in electron beam lithography Chun-Hung Liu;Hoi-Tou Ng;Philip C. W. Ng;Kuen-Yu Tsai;Shy-Jay Lin;Jeng-Horng Chen; Chun-Hung Liu; Hoi-Tou Ng; Philip C. W. Ng; Kuen-Yu Tsai; Shy-Jay Lin; Jeng-Horng Chen; KUEN-YU TSAI
臺大學術典藏 2018-09-10T06:35:26Z Real-time spatial control of photoresist development rate Arthur Tay; Weng-Khuen Ho; Ni Hu; Choon-Meng Kiew; Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏 2018-09-10T06:35:26Z Real-time spatial control of photoresist development rate Arthur Tay; Weng-Khuen Ho; Ni Hu; Choon-Meng Kiew; Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏 2018-09-10T06:35:26Z Servo System Design of a High-Resolution Piezo-Driven Three Degree-of-Freedom Fine Stage for Integrated-Circuit Wafer Step-and-Repeat Lithography Systems Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏 2018-09-10T06:35:26Z Servo System Design of a High-Resolution Piezo-Driven Three Degree-of-Freedom Fine Stage for Integrated-Circuit Wafer Step-and-Repeat Lithography Systems Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏 2018-09-10T06:35:25Z Impacts of optical proximity correction settings on electrical performances Meng-Fu You; Philip C. W. Ng; Yi-Sheng Su; Kuen-Yu Tsai; Yi-Chang Lu; YI-CHANG LU; KUEN-YU TSAI
臺大學術典藏 2018-09-10T06:35:25Z Impacts of optical proximity correction settings on electrical performances Meng-Fu You; Philip C. W. Ng; Yi-Sheng Su; Kuen-Yu Tsai; Yi-Chang Lu; YI-CHANG LU; KUEN-YU TSAI
臺大學術典藏 2018-09-10T06:02:40Z Method for Fast Design of Multi-objective Frequency-shaping Equalizers Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏 2018-09-10T06:02:40Z Method for Fast Design of Multi-objective Frequency-shaping Equalizers Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏 2018-09-10T06:02:39Z A fast in situ approach to estimating wafer warpage profile during thermal processing in microlithography Ni Hu; Arthur Tay; Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏 2018-09-10T06:02:39Z A fast in situ approach to estimating wafer warpage profile during thermal processing in microlithography Ni Hu; Arthur Tay; Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏 2018-09-10T06:02:39Z Real-time spatial control of steady-state wafer temperature during thermal processing in microlithography Arthur Tay; Weng-Khuen Ho; Ni Hu; Kuen-Yu Tsai; Ying Zhou; KUEN-YU TSAI
臺大學術典藏 2018-09-10T06:02:39Z Real-time spatial control of steady-state wafer temperature during thermal processing in microlithography Arthur Tay; Weng-Khuen Ho; Ni Hu; Kuen-Yu Tsai; Ying Zhou; KUEN-YU TSAI
臺大學術典藏 2018-09-10T06:02:39Z Identifications of the PZT Actuated Novel Optical Scanning System Yea-Chin Yeh; Chun-Hung Liu; Kuen-Yu Tsai; Yu-Chen Kung; Jia-Yush Yen; Jyh-Fa Lee; KUEN-YU TSAI
臺大學術典藏 2018-09-10T06:02:39Z Identifications of the PZT Actuated Novel Optical Scanning System Yea-Chin Yeh; Chun-Hung Liu; Kuen-Yu Tsai; Yu-Chen Kung; Jia-Yush Yen; Jyh-Fa Lee; KUEN-YU TSAI
臺大學術典藏 2018-09-10T06:02:39Z Feedback control of piezo-based nanopositioning systems for semiconductor manufacturing Kuen-Yu Tsai; Jia-Yush Yen; Arthur Tay; Jyh-Fa Lee; KUEN-YU TSAI; Yea-Chin Yeh; Chun-Hung Liu
臺大學術典藏 2018-09-10T06:02:39Z Feedback control of piezo-based nanopositioning systems for semiconductor manufacturing Kuen-Yu Tsai; Jia-Yush Yen; Arthur Tay; Jyh-Fa Lee; KUEN-YU TSAI; Yea-Chin Yeh; Chun-Hung Liu
臺大學術典藏 2018-09-10T05:27:09Z In-situ fault detection of wafer warpage in lithography Arthur Tay; Weng Khuen Ho; Christopher Yap; Chen Wei; Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏 2018-09-10T05:27:09Z In-situ fault detection of wafer warpage in lithography Arthur Tay; Weng Khuen Ho; Christopher Yap; Chen Wei; Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏 2018-09-10T05:27:09Z On the sensitivity improvement and cross-correlation methodology for confocal EUV mask blank defect inspection tool fleet Kuen-Yu Tsai; Eric M. Gullikson; Patrick Kearney; Alan R. Stivers; KUEN-YU TSAI
臺大學術典藏 2018-09-10T05:27:09Z On the sensitivity improvement and cross-correlation methodology for confocal EUV mask blank defect inspection tool fleet Kuen-Yu Tsai; Eric M. Gullikson; Patrick Kearney; Alan R. Stivers; KUEN-YU TSAI
臺大學術典藏 2018-09-10T05:27:08Z Modeling the defect inspection sensitivity of a confocal microscope Eric M. Gullikson; Edita Tejnil; Kuen-Yu Tsai; Alan R. Stivers; H. Kusunose; KUEN-YU TSAI
臺大學術典藏 2018-09-10T05:27:08Z Modeling the defect inspection sensitivity of a confocal microscope Eric M. Gullikson; Edita Tejnil; Kuen-Yu Tsai; Alan R. Stivers; H. Kusunose; KUEN-YU TSAI
臺大學術典藏 2018-09-10T04:59:22Z Design of feedforward filters for improving tracking performances of existing feedback control systems Kuen-Yu Tsai; Charles D. Schaper; Thomas Kailath; KUEN-YU TSAI
臺大學術典藏 2018-09-10T04:59:22Z Design of feedforward filters for improving tracking performances of existing feedback control systems Kuen-Yu Tsai; Charles D. Schaper; Thomas Kailath; KUEN-YU TSAI
臺大學術典藏 2018-09-10T04:59:22Z DQIT: μ-synthesis without D-scale fitting Kuen-Yu Tsai*; Haitham A. Hindi; KUEN-YU TSAI
臺大學術典藏 2018-09-10T04:59:22Z DQIT: μ-synthesis without D-scale fitting Kuen-Yu Tsai*; Haitham A. Hindi; KUEN-YU TSAI
臺大學術典藏 2018-09-10T04:59:22Z Method for Design of Multi-objective Robust Controllers Kuen-Yu Tsai; Haitham A. Hindi; KUEN-YU TSAI
臺大學術典藏 2018-09-10T04:59:22Z Method for Design of Multi-objective Robust Controllers Kuen-Yu Tsai; Haitham A. Hindi; KUEN-YU TSAI
臺大學術典藏 2018-09-10T04:15:19Z Design of Feedforward and Feedback Controllers by Signal Processing and Convex Optimization Techniques Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏 2018-09-10T04:15:19Z Design of Feedforward and Feedback Controllers by Signal Processing and Convex Optimization Techniques Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏 2018 Focused helium ion beam applications in advanced-node nanolithography R/D Kuen-Yu Tsai*; KUEN-YU TSAI; Sheng-Wei Chien; Chien-Lin Lee; KUEN-YU TSAI;Kuen-Yu Tsai*;Sheng-Wei Chien;Chien-Lin Lee
臺大學術典藏 2018 Focused helium ion beam applications in advanced-node nanolithography R/D Kuen-Yu Tsai*; KUEN-YU TSAI; Sheng-Wei Chien; Chien-Lin Lee; KUEN-YU TSAI;Kuen-Yu Tsai*;Sheng-Wei Chien;Chien-Lin Lee
臺大學術典藏 2018 Focused helium ion beam applications in advanced-node nanolithography R/D Kuen-Yu Tsai*; KUEN-YU TSAI; Sheng-Wei Chien; Chien-Lin Lee; KUEN-YU TSAI;Kuen-Yu Tsai*;Sheng-Wei Chien;Chien-Lin Lee
臺大學術典藏 2018 Focused helium ion beam applications in advanced-node nanolithography R/D Kuen-Yu Tsai*; KUEN-YU TSAI; Sheng-Wei Chien; Chien-Lin Lee; KUEN-YU TSAI;Kuen-Yu Tsai*;Sheng-Wei Chien;Chien-Lin Lee
臺大學術典藏 2015-07 Determining Proximity Effect Parameters for Non-Rectangular Semiconductor Structures KUEN-YU TSAI; Yi-Chang Lu; Meng-Fu You; Kuen-Yu Tsai; Kuen-Yu Tsai;Meng-Fu You;Yi-Chang Lu
臺大學術典藏 2015-07 Determining Proximity Effect Parameters for Non-Rectangular Semiconductor Structures KUEN-YU TSAI; Yi-Chang Lu; Meng-Fu You; Kuen-Yu Tsai; Kuen-Yu Tsai;Meng-Fu You;Yi-Chang Lu
臺大學術典藏 2015-07 Determining Proximity Effect Parameters for Non-Rectangular Semiconductor Structures KUEN-YU TSAI; Yi-Chang Lu; Meng-Fu You; Kuen-Yu Tsai; Kuen-Yu Tsai;Meng-Fu You;Yi-Chang Lu
臺大學術典藏 2014-05 Method for Compensating Proximity Effect of Particle Beam Lithography Process (粒子束微影程序鄰近效應之補償方法) KUEN-YU TSAI; Pei-Lin Tien; Chooi-Wan Ng; Chun-Hung Liu; Kuen-Yu Tsai;Chun-Hung Liu;Chooi-Wan Ng;Pei-Lin Tien; Kuen-Yu Tsai
臺大學術典藏 2014-05 Method for Compensating Proximity Effect of Particle Beam Lithography Process (粒子束微影程序鄰近效應之補償方法) KUEN-YU TSAI; Pei-Lin Tien; Chooi-Wan Ng; Chun-Hung Liu; Kuen-Yu Tsai;Chun-Hung Liu;Chooi-Wan Ng;Pei-Lin Tien; Kuen-Yu Tsai
臺大學術典藏 2014-05 Method for Compensating Proximity Effect of Particle Beam Lithography Process (粒子束微影程序鄰近效應之補償方法) KUEN-YU TSAI; Pei-Lin Tien; Chooi-Wan Ng; Chun-Hung Liu; Kuen-Yu Tsai;Chun-Hung Liu;Chooi-Wan Ng;Pei-Lin Tien; Kuen-Yu Tsai
臺大學術典藏 2012-02 Electron-beam proximity effect model calibration for fabricating scatterometry calibration samples Chun-Hung Liu; Chih-Yu Chen; Hoi-Tou Ng; Kuen-Yu Tsai; Fu-Ming Wang; Chieh-Hsiung Kuan; Yen-Min Lee; Hsin-Hung Cheng; Jia-Han Li; Alek C. Chen; Yu-Tian Shen; KUEN-YU TSAI; CHIEH-HSIUNG KUAN et al.
臺大學術典藏 2012-02 Electron-beam proximity effect model calibration for fabricating scatterometry calibration samples Chun-Hung Liu; Chih-Yu Chen; Hoi-Tou Ng; Kuen-Yu Tsai; Fu-Ming Wang; Chieh-Hsiung Kuan; Yen-Min Lee; Hsin-Hung Cheng; Jia-Han Li; Alek C. Chen; Yu-Tian Shen; KUEN-YU TSAI; CHIEH-HSIUNG KUAN et al.

Showing items 266-313 of 313  (7 Page(s) Totally)
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