臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

	English \| 正體中文 \| 简体中文 \| 總筆數 :0
	造訪人次 : 52916400 線上人數 : 560 教育部委託研究計畫計畫執行:國立臺灣大學圖書館

搜尋範圍

進階搜尋

登入

管理

臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

關於TAIR
	計畫說明

瀏覽
	典藏機構
	作者
	題名
	日期
	統計圖表
	機構即時統計
	學術趨勢

消息
	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

著作權
	出版社及期刊政策查詢
	TAIR著作權會議記錄

相關連結
	機構典藏計畫網站
	ROAR
	OpenDOAR
	SHERPA
	OAIster
	JAIRO
	Ira
	DSPACE
	RWWR
	臺大學術典藏NTU Scholars

"kuen yu tsai"的相關文件

回到依作者瀏覽
依題名排序	依日期排序

顯示項目 201-210 / 313 (共32頁)
<< < 16 17 18 19 20 21 22 23 24 25 > >>
每頁顯示[10|25|50]項目

機構	日期	題名	作者
臺大學術典藏	2018-09-10T08:18:22Z	Impacts of point spread function calibration methods on model-based proximity effect correction for electron-beam-direct-write lithography	Chun-Hung Liu;Philip Ng;Yu-Tian Shen;Hoi-Tou Ng;Kuen-Yu Tsai; Chun-Hung Liu; Philip Ng; Yu-Tian Shen; Hoi-Tou Ng; Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏	2018-09-10T08:18:22Z	Impacts of point spread function calibration methods on model-based proximity effect correction for electron-beam-direct-write lithography	Chun-Hung Liu;Philip Ng;Yu-Tian Shen;Hoi-Tou Ng;Kuen-Yu Tsai; Chun-Hung Liu; Philip Ng; Yu-Tian Shen; Hoi-Tou Ng; Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏	2018-09-10T08:18:22Z	Impacts of point spread function calibration methods on model-based proximity effect correction for electron-beam-direct-write lithography	Chun-Hung Liu;Philip Ng;Yu-Tian Shen;Hoi-Tou Ng;Kuen-Yu Tsai; Chun-Hung Liu; Philip Ng; Yu-Tian Shen; Hoi-Tou Ng; Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏	2018-09-10T08:18:22Z	10 nm lines with 14 nm half pitch grating written in HSQ by electron beam direct write at 5 keV	Fu-Min Wang;Susumu Ono;Hsin-Hung Su;Kuen-Yu Tsai;Chieh-Hsiung Kuan; Fu-Min Wang; Susumu Ono; Hsin-Hung Su; Kuen-Yu Tsai; Chieh-Hsiung Kuan; KUEN-YU TSAI
臺大學術典藏	2018-09-10T08:18:22Z	10 nm lines with 14 nm half pitch grating written in HSQ by electron beam direct write at 5 keV	Fu-Min Wang;Susumu Ono;Hsin-Hung Su;Kuen-Yu Tsai;Chieh-Hsiung Kuan; Fu-Min Wang; Susumu Ono; Hsin-Hung Su; Kuen-Yu Tsai; Chieh-Hsiung Kuan; KUEN-YU TSAI
臺大學術典藏	2018-09-10T08:18:22Z	10 nm lines with 14 nm half pitch grating written in HSQ by electron beam direct write at 5 keV	Fu-Min Wang;Susumu Ono;Hsin-Hung Su;Kuen-Yu Tsai;Chieh-Hsiung Kuan; Fu-Min Wang; Susumu Ono; Hsin-Hung Su; Kuen-Yu Tsai; Chieh-Hsiung Kuan; KUEN-YU TSAI
臺大學術典藏	2018-09-10T08:18:22Z	A non-delta-chrome OPC methodology for nonlinear process models	Philip C. W. Ng;Kuen-Yu Tsai;Lawrence S. Melvin III; Philip C. W. Ng; Kuen-Yu Tsai; Lawrence S. Melvin III; KUEN-YU TSAI
臺大學術典藏	2018-09-10T08:18:22Z	A non-delta-chrome OPC methodology for nonlinear process models	Philip C. W. Ng;Kuen-Yu Tsai;Lawrence S. Melvin III; Philip C. W. Ng; Kuen-Yu Tsai; Lawrence S. Melvin III; KUEN-YU TSAI
臺大學術典藏	2018-09-10T08:18:22Z	A non-delta-chrome OPC methodology for nonlinear process models	Philip C. W. Ng;Kuen-Yu Tsai;Lawrence S. Melvin III; Philip C. W. Ng; Kuen-Yu Tsai; Lawrence S. Melvin III; KUEN-YU TSAI
臺大學術典藏	2018-09-10T08:18:21Z	Stochastic simulation of photon scattering for EUV mask defect inspection	Ting-Hang Pei;Kuen-Yu Tsai;Jia-Han Li; Ting-Hang Pei; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI

顯示項目 201-210 / 313 (共32頁)
<< < 16 17 18 19 20 21 22 23 24 25 > >>
每頁顯示[10|25|50]項目