臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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显示项目 31-80 / 313 (共7页)
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机构	日期	题名	作者
臺大學術典藏	2019-10-31T07:58:04Z	Simulation-based proximity effect correction for helium ion beam lithography	KUEN-YU TSAI;Kuen-Yu Tsai;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏	2019-10-31T07:58:03Z	Model-based proximity effect correction for helium ion beam lithography	KUEN-YU TSAI;Kuen-Yu Tsai;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏	2019-10-31T07:58:03Z	Model-based proximity effect correction for helium ion beam lithography	KUEN-YU TSAI;Kuen-Yu Tsai;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏	2019-10-31T07:58:03Z	Model-based proximity effect correction for helium ion beam lithography	KUEN-YU TSAI;Kuen-Yu Tsai;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏	2019-10-31T07:58:03Z	Model-based proximity effect correction for helium ion beam lithography	KUEN-YU TSAI;Kuen-Yu Tsai;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏	2019-10-31T07:58:01Z	Fabrication of metrology test structures with helium ion beam direct write	KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI
臺大學術典藏	2019-10-31T07:58:01Z	Fabrication of metrology test structures with helium ion beam direct write	KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI
臺大學術典藏	2019-10-31T07:58:01Z	Fabrication of metrology test structures with helium ion beam direct write	KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI
臺大學術典藏	2019-10-31T07:58:01Z	Fabrication of metrology test structures with helium ion beam direct write	KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI
臺大學術典藏	2019-10-31T07:58:00Z	Fabrication of metrology test structures with helium ion beam direct write	KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI
臺大學術典藏	2019-10-31T07:58:00Z	Fabrication of metrology test structures with helium ion beam direct write	KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI
臺大學術典藏	2019-10-31T07:58:00Z	Fabrication of metrology test structures with helium ion beam direct write	KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI
臺大學術典藏	2019-10-31T07:58:00Z	Fabrication of metrology test structures with helium ion beam direct write	KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI
臺大學術典藏	2019-10-31T07:57:58Z	Fabrication of metrology test structures with programmed imperfection using helium ion beam direct write	KUEN-YU TSAI;Jia-Han Li;Kuen-Yu Tsai;Sheng-Wei Chien; Sheng-Wei Chien; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI
臺大學術典藏	2019-10-31T07:57:58Z	Fabrication of metrology test structures with programmed imperfection using helium ion beam direct write	KUEN-YU TSAI;Jia-Han Li;Kuen-Yu Tsai;Sheng-Wei Chien; Sheng-Wei Chien; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI
臺大學術典藏	2019-10-31T07:57:58Z	Fabrication of metrology test structures with programmed imperfection using helium ion beam direct write	KUEN-YU TSAI;Jia-Han Li;Kuen-Yu Tsai;Sheng-Wei Chien; Sheng-Wei Chien; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI
臺大學術典藏	2019-10-31T07:57:58Z	Fabrication of metrology test structures with programmed imperfection using helium ion beam direct write	KUEN-YU TSAI;Jia-Han Li;Kuen-Yu Tsai;Sheng-Wei Chien; Sheng-Wei Chien; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:36:26Z	Method and System for Establishing Parametric Model	Kuen-Yu Tsai; Chun-Hung Liu; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:36:26Z	Method and System for Establishing Parametric Model	Kuen-Yu Tsai; Chun-Hung Liu; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:26:03Z	Design of an electron-optical system with a ball-tip emission source through a numerical optimization method for high-throughput electron-beam–direct-write lithography	Yu-Tian Shen; Kuen-Yu Tsai; KUEN-YU TSAI; Hsuan-Ping Lee;Sheng-Yung Chen;Chun-Hung Liu;Ding-Qi;Yu-Tian Shen;Kuen-Yu Tsai; Hsuan-Ping Lee; Sheng-Yung Chen; Chun-Hung Liu; Ding-Qi
臺大學術典藏	2018-09-10T15:26:03Z	Design of an electron-optical system with a ball-tip emission source through a numerical optimization method for high-throughput electron-beam–direct-write lithography	Yu-Tian Shen; Kuen-Yu Tsai; KUEN-YU TSAI; Hsuan-Ping Lee;Sheng-Yung Chen;Chun-Hung Liu;Ding-Qi;Yu-Tian Shen;Kuen-Yu Tsai; Hsuan-Ping Lee; Sheng-Yung Chen; Chun-Hung Liu; Ding-Qi
臺大學術典藏	2018-09-10T15:26:03Z	Design of an electron-optical system with a ball-tip emission source through a numerical optimization method for high-throughput electron-beam–direct-write lithography	Yu-Tian Shen; Kuen-Yu Tsai; KUEN-YU TSAI; Hsuan-Ping Lee;Sheng-Yung Chen;Chun-Hung Liu;Ding-Qi;Yu-Tian Shen;Kuen-Yu Tsai; Hsuan-Ping Lee; Sheng-Yung Chen; Chun-Hung Liu; Ding-Qi
臺大學術典藏	2018-09-10T15:26:03Z	Comparison of the vectorial diffraction theory and Fraunhofer approximation method on diffractive images of Fresnel zone plates	Ting-Hang Pei;Kuen-Yu Tsai;Jia-Han Li; Ting-Hang Pei; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:26:03Z	Comparison of the vectorial diffraction theory and Fraunhofer approximation method on diffractive images of Fresnel zone plates	Ting-Hang Pei;Kuen-Yu Tsai;Jia-Han Li; Ting-Hang Pei; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:26:03Z	Comparison of the vectorial diffraction theory and Fraunhofer approximation method on diffractive images of Fresnel zone plates	Ting-Hang Pei;Kuen-Yu Tsai;Jia-Han Li; Ting-Hang Pei; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:26:03Z	Supplementary zones-surrounded Fresnel zone plate with enhanced optical resolution	Yen-Min Lee;Szu-Hung Chen;Chen-Pin Hsu;Pei-Chuen Chiou;Kuen-Yu Tsai;Tien-Tung Chung;Cheng-Han Tsai;Zhan-Yu Liu;Jia-Han Li; Yen-Min Lee; Szu-Hung Chen; Chen-Pin Hsu; Pei-Chuen Chiou; Kuen-Yu Tsai; Tien-Tung Chung; Cheng-Han Tsai; Zhan-Yu Liu; Jia-Han Li; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:26:03Z	Supplementary zones-surrounded Fresnel zone plate with enhanced optical resolution	Yen-Min Lee;Szu-Hung Chen;Chen-Pin Hsu;Pei-Chuen Chiou;Kuen-Yu Tsai;Tien-Tung Chung;Cheng-Han Tsai;Zhan-Yu Liu;Jia-Han Li; Yen-Min Lee; Szu-Hung Chen; Chen-Pin Hsu; Pei-Chuen Chiou; Kuen-Yu Tsai; Tien-Tung Chung; Cheng-Han Tsai; Zhan-Yu Liu; Jia-Han Li; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:26:03Z	Supplementary zones-surrounded Fresnel zone plate with enhanced optical resolution	Yen-Min Lee;Szu-Hung Chen;Chen-Pin Hsu;Pei-Chuen Chiou;Kuen-Yu Tsai;Tien-Tung Chung;Cheng-Han Tsai;Zhan-Yu Liu;Jia-Han Li; Yen-Min Lee; Szu-Hung Chen; Chen-Pin Hsu; Pei-Chuen Chiou; Kuen-Yu Tsai; Tien-Tung Chung; Cheng-Han Tsai; Zhan-Yu Liu; Jia-Han Li; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:26:03Z	Multilayer Mirror Structure (多層反射鏡結構)	Jia-Han Li;Yen-Min Lee;Kuen-Yu Tsai; Jia-Han Li; Yen-Min Lee; Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:26:03Z	Multilayer Mirror Structure (多層反射鏡結構)	Jia-Han Li;Yen-Min Lee;Kuen-Yu Tsai; Jia-Han Li; Yen-Min Lee; Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:26:03Z	Multilayer Mirror Structure (多層反射鏡結構)	Jia-Han Li;Yen-Min Lee;Kuen-Yu Tsai; Jia-Han Li; Yen-Min Lee; Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:00:25Z	System and Method for Estimating Change of Status of Particle Beams (粒子束狀態改變監測系統及其方法)	Kuen-Yu Tsai;Sheng-Yung Chen;Jia-Yush Yen;Yung-Yaw Chen;Chi-Hsiang Fan; Kuen-Yu Tsai; Sheng-Yung Chen; Jia-Yush Yen; Yung-Yaw Chen; Chi-Hsiang Fan; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:00:25Z	System and Method for Estimating Change of Status of Particle Beams (粒子束狀態改變監測系統及其方法)	Kuen-Yu Tsai;Sheng-Yung Chen;Jia-Yush Yen;Yung-Yaw Chen;Chi-Hsiang Fan; Kuen-Yu Tsai; Sheng-Yung Chen; Jia-Yush Yen; Yung-Yaw Chen; Chi-Hsiang Fan; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:00:25Z	System and Method for Estimating Change of Status of Particle Beams (粒子束狀態改變監測系統及其方法)	Kuen-Yu Tsai;Sheng-Yung Chen;Jia-Yush Yen;Yung-Yaw Chen;Chi-Hsiang Fan; Kuen-Yu Tsai; Sheng-Yung Chen; Jia-Yush Yen; Yung-Yaw Chen; Chi-Hsiang Fan; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:00:24Z	Refractive index and effective thickness measurement system for the RGB color filter coatings with absorption and scattering properties	Yen-Min Lee;Hsin-Hung Cheng;Jia-Han Li;Kuen-Yu Tsai;Yu-Tian Sheng; Yen-Min Lee; Hsin-Hung Cheng; Jia-Han Li; Kuen-Yu Tsai; Yu-Tian Sheng; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:00:24Z	Refractive index and effective thickness measurement system for the RGB color filter coatings with absorption and scattering properties	Yen-Min Lee;Hsin-Hung Cheng;Jia-Han Li;Kuen-Yu Tsai;Yu-Tian Sheng; Yen-Min Lee; Hsin-Hung Cheng; Jia-Han Li; Kuen-Yu Tsai; Yu-Tian Sheng; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:00:24Z	Refractive index and effective thickness measurement system for the RGB color filter coatings with absorption and scattering properties	Yen-Min Lee;Hsin-Hung Cheng;Jia-Han Li;Kuen-Yu Tsai;Yu-Tian Sheng; Yen-Min Lee; Hsin-Hung Cheng; Jia-Han Li; Kuen-Yu Tsai; Yu-Tian Sheng; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:00:24Z	Optical scatterometry system for detecting specific line edge roughness of resist gratings subjected to detector noises	Yen-Min Lee;Jia-Han Li;Fu-Min Wang;Hsin-Hung Cheng;Yu-Tian Shen;Kuen-Yu Tsai;Jason Shieh;Alek Chen; Yen-Min Lee; Jia-Han Li; Fu-Min Wang; Hsin-Hung Cheng; Yu-Tian Shen; Kuen-Yu Tsai; Jason Shieh; Alek Chen; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:00:24Z	Optical scatterometry system for detecting specific line edge roughness of resist gratings subjected to detector noises	Yen-Min Lee;Jia-Han Li;Fu-Min Wang;Hsin-Hung Cheng;Yu-Tian Shen;Kuen-Yu Tsai;Jason Shieh;Alek Chen; Yen-Min Lee; Jia-Han Li; Fu-Min Wang; Hsin-Hung Cheng; Yu-Tian Shen; Kuen-Yu Tsai; Jason Shieh; Alek Chen; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:00:24Z	Optical scatterometry system for detecting specific line edge roughness of resist gratings subjected to detector noises	Yen-Min Lee;Jia-Han Li;Fu-Min Wang;Hsin-Hung Cheng;Yu-Tian Shen;Kuen-Yu Tsai;Jason Shieh;Alek Chen; Yen-Min Lee; Jia-Han Li; Fu-Min Wang; Hsin-Hung Cheng; Yu-Tian Shen; Kuen-Yu Tsai; Jason Shieh; Alek Chen; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:00:24Z	Improvement in electron-beam lithography throughput by exploiting relaxed patterning fidelity requirements with directed self-assembly	Hao-Yun Yu;Chun-Hung Liu;Yu-Tian Shen;Hsuan-Ping Lee;Kuen-Yu Tsai; Hao-Yun Yu; Chun-Hung Liu; Yu-Tian Shen; Hsuan-Ping Lee; Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:00:24Z	Improvement in electron-beam lithography throughput by exploiting relaxed patterning fidelity requirements with directed self-assembly	Hao-Yun Yu;Chun-Hung Liu;Yu-Tian Shen;Hsuan-Ping Lee;Kuen-Yu Tsai; Hao-Yun Yu; Chun-Hung Liu; Yu-Tian Shen; Hsuan-Ping Lee; Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:00:24Z	Improvement in electron-beam lithography throughput by exploiting relaxed patterning fidelity requirements with directed self-assembly	Hao-Yun Yu;Chun-Hung Liu;Yu-Tian Shen;Hsuan-Ping Lee;Kuen-Yu Tsai; Hao-Yun Yu; Chun-Hung Liu; Yu-Tian Shen; Hsuan-Ping Lee; Kuen-Yu Tsai; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:00:24Z	Direct-scatterometry-enabled PEC model calibration with two-dimensional layouts	Yi-Yeh Yang;Hsuan-Ping Lee;Chun-Hung Liu;Hao-Yun Yu;Kuen-Yu Tsai;Jia-Han Li; Yi-Yeh Yang; Hsuan-Ping Lee; Chun-Hung Liu; Hao-Yun Yu; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:00:24Z	Direct-scatterometry-enabled PEC model calibration with two-dimensional layouts	Yi-Yeh Yang;Hsuan-Ping Lee;Chun-Hung Liu;Hao-Yun Yu;Kuen-Yu Tsai;Jia-Han Li; Yi-Yeh Yang; Hsuan-Ping Lee; Chun-Hung Liu; Hao-Yun Yu; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:00:24Z	Direct-scatterometry-enabled PEC model calibration with two-dimensional layouts	Yi-Yeh Yang;Hsuan-Ping Lee;Chun-Hung Liu;Hao-Yun Yu;Kuen-Yu Tsai;Jia-Han Li; Yi-Yeh Yang; Hsuan-Ping Lee; Chun-Hung Liu; Hao-Yun Yu; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:00:24Z	A New EUV Mask Blank Defect Inspection Method with Coherent Diffraction Imaging	Ding Qi;Kuen-Yu Tsai;Jia-Han Li; Ding Qi; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:00:24Z	A New EUV Mask Blank Defect Inspection Method with Coherent Diffraction Imaging	Ding Qi;Kuen-Yu Tsai;Jia-Han Li; Ding Qi; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:00:24Z	A New EUV Mask Blank Defect Inspection Method with Coherent Diffraction Imaging	Ding Qi;Kuen-Yu Tsai;Jia-Han Li; Ding Qi; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI
臺大學術典藏	2018-09-10T15:00:24Z	Electron-Beam Lithographic Method, System and Method For Controlling Electron-Beam Servo (電子束微影方法、電子束微影伺服控制方法及系統)	Jia-Yush Yen;Kuen-Yu Tsai;Lien-Sheng Chen;Pablo Chiu;Hsin-Fan Tsai; Jia-Yush Yen; Kuen-Yu Tsai; Lien-Sheng Chen; Pablo Chiu; Hsin-Fan Tsai; KUEN-YU TSAI

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	造访人次 : 52735784 在线人数 : 558 教育部委托研究计画计画执行:国立台湾大学图书馆