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Institution Date Title Author
國立交通大學 2014-12-08T15:37:33Z Experimental Investigation of Surface-Roughness-Limited Mobility in Uniaxial Strained pMOSFETs Chen, William P. N.; Kuo, Jack J. Y.; Su, Pin
國立交通大學 2014-12-08T15:32:43Z Source/Drain Series Resistance Induced Feedback Effect on Drain Current Mismatch and Its Implication Kuo, Jack J. -Y.; Fan, Ming-Long; Lee, Wei; Su, Pin
國立交通大學 2014-12-08T15:24:28Z Investigation of Low Frequency Noise in Uniaxial Strained PMOSFETs Kuo, Jack J. -Y.; Chen, William P. -N.; Su, Pin
國立交通大學 2014-12-08T15:21:55Z Impact of Uniaxial Strain on Channel Backscattering Characteristics and Drain Current Variation for Nanoscale PMOSFETs Lee, Wei; Kuo, Jack J. -Y.; Chen, Willian P. -N.; Su, Pin; Jeng, Min-Chie
國立交通大學 2014-12-08T15:21:19Z Self-Heating Induced Feedback Effect on Drain Current Mismatch and Its Modeling Kuo, Jack J-Y.; Su, Pin
國立交通大學 2014-12-08T15:14:23Z Investigation of analogue performance for process-induced-strained PMOSFETs Kuo, Jack J-Y; Chen, William P-N; Su, Pin
國立交通大學 2014-12-08T15:13:45Z On the enhanced impact ionization in uniaxial strained p-MOSFETs Su, Pin; Kuo, Jack J. -Y.
國立交通大學 2014-12-08T15:09:23Z Impact of Uniaxial Strain on Low-Frequency Noise in Nanoscale PMOSFETs Kuo, Jack J. -Y.; Chen, William P. -N.; Su, Pin
國立交通大學 2014-12-08T15:06:58Z Impact of Process-Induced Uniaxial Strain on the Temperature Dependence of Carrier Mobility in Nanoscale pMOSFETs Chen, William P. N.; Kuo, Jack J. Y.; Su, Pin
國立交通大學 2014-12-08T15:06:58Z Enhanced Carrier-Mobility-Fluctuation Origin Low-Frequency Noise in Uniaxial Strained PMOSFETs Kuo, Jack J. -Y.; Chen, William P. -N.; Su, Pin

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