臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
義守大學	2013-02	The impact of interface/border defect on performance and reliability of high-k/metal-gate CMOSFET	Wen-Kuan Yeh;Po-Ying Chen;Kwang-Jow Gan;Jer-Chyi Wang;Chao Sung Lai
義守大學	2011-03	The Improvement of High-k/Metal Gate pMOSFET Performance and Reliability using Optimized Si cap/SiGe Channel Structure	Wen-Kuan Yeh;Yu-Ting Chen;Fon-Shan Huang;Chia-Wei Hsu;Chun-Yu Chen;Yean-Kuen Fang;Kwang-Jow Gan;Po-Ying Chen

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