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Institution Date Title Author
元智大學 2011-02 Semiconductor Manufacturing Yield Enhancement through Cycle Time and Tool Commonality Analysis Kwok-Wang Ngai; Chih-Min Fan
元智大學 2011 以逐步迴歸結合皮爾森相關係數近似值與逐段線性建模進行以生產週期時間為主之晶圓良率分析 倪國宏; Kwok-Wang Ngai
元智大學 2010-12 Fast Screening and Identification of Critical Cycle Time for Semiconductor Manufacturing Yield Analysis Kwok-Wang Ngai; Chih-Min Fan
元智大學 2010-02 Screening and Identification of Time Constraint for Semiconductor Manufacturing Yield Analysis 范治民; Kwok Wang Ngai
元智大學 2009-11 Fast Identification of Critical Cycle Time for Semiconductor Manufacturing Yield Analysis 范治民; Kwok-Wang Ngai

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