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Showing items 11-20 of 30  (3 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:39:51Z Light emission near 1.3 mu m using ITO-Al2O3-Si0.3Ge0.7-Si tunnel diodes Lin, CY; Chin, A; Hou, YT; Li, MF; McAlister, SP; Kwong, DL
國立交通大學 2014-12-08T15:39:32Z Al2O3-Ge-On-insulator n- and p-MOSFETs with fully NiSi and NiGe dual gates Yu, DS; Huang, CH; Chin, A; Zhu, CX; Li, MF; Cho, BJ; Kwong, DL
國立交通大學 2014-12-08T15:39:16Z Schottky-barrier S/D MOSFETs with high-K gate dielectrics and metal-gate electrode Zhu, SY; Yu, HY; Whang, SJ; Chen, JH; Shen, C; Zhu, CX; Lee, SJ; Li, MF; Chan, DSH; Yoo, WJ; Du, AY; Tung, CH; Singh, J; Chin, A; Kwong, DL
國立交通大學 2014-12-08T15:39:11Z Effect of surface NH3 anneal on the physical and electrical properties of HfO2 films on Ge substrate Wu, N; Zhang, QC; Zhu, CX; Yeo, CC; Whang, SJ; Chan, DSH; Li, MF; Cho, BJ; Chin, A; Kwong, DL; Du, AY; Tung, CH; Balasubramanian, N
國立交通大學 2014-12-08T15:39:00Z RF, DC, and reliability characteristics of ALD HfO2-Al2O3 laminate MIM capacitors for Si RF IC applications Ding, SJ; Hu, H; Zhu, CX; Kim, SJ; Yu, XF; Li, MF; Cho, BJ; Chan, DSH; Yu, MB; Rustagi, SC; Chin, A; Kwong, DL
國立交通大學 2014-12-08T15:38:45Z N-type Schottky barrier source/drain MOSFET using ytterbium silicide Zhu, SY; Chen, JD; Li, MF; Lee, SJ; Singh, J; Zhu, CX; Du, AY; Tung, CH; Chin, A; Kwong, DL
國立交通大學 2014-12-08T15:38:36Z A TaN-HfO2-Ge pMOSFET with novel SiH4 surface passivation Wu, N; Zhang, QC; Zhu, CX; Chan, DSH; Du, AY; Balasubramanian, N; Li, MF; Chin, A; Sin, JKO; Kwong, DL
國立交通大學 2014-12-08T15:38:31Z Electron mobility in Ge and strained-Si channel ultrathin-body metal-oxide semi conductor field-effect transistors Low, T; Li, MF; Shen, C; Yeo, YC; Hou, YT; Zhu, CX; Chin, A; Kwong, DL
國立交通大學 2014-12-08T15:38:27Z Low temperature MOSFET technology with Schottky barrier source/drain, high-K gate dielectric and metal gate electrode Zhu, SY; Yu, HY; Chen, JD; Whang, SJ; Chen, JH; Shen, C; Zhu, CX; Lee, SJ; Li, MF; Chan, DSH; Yoo, WJ; Du, AY; Tung, CH; Singh, J; Chin, A; Kwong, DL
國立交通大學 2014-12-08T15:38:26Z Electrical characteristics and suppressed boron penetration behavior of thermally stable HfTaO gate dielectrics with polycrystalline-silicon gate Yu, XF; Zhu, CX; Li, MF; Chin, A; Du, AY; Wang, WD; Kwong, DL

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