臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

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Showing items 76-85 of 87 (9 Page(s) Totally)
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Institution	Date	Title	Author
國立臺灣科技大學	2001	Bonding characterization and nano-indentation study of the amorphous SiCxNy films with and without hydrogen incorporation	K.H. Chen;L.C. Chen;S.T. Lin;H.C. Lo;C.Y. Wen;T.S. Wong;J.J. Wu
國立中山大學	2001	Electronic structure of oxidized Ni/Au contacts on p-GaN investigated by x-ray absorption spectroscopy	J.C. Jan;K. Asokan;J.W. Chiou;W.F. Pong;P.K. Tseng;M.H. Tsai;Y.K. Chang;Y.Y. Chen;J.F. Lee;J.S. Wu;H.J. Lin;C.T. Chen;L.C. Chen;F.R. Chen;J.K. Ho
國立中山大學	2001	Electronic structure of the Fe-layer catalyzed carbon nanotubes studied by x-ray-absorption spectroscopy	C.L. Yueh;C.J. Jan;J.W. Chiou;W.F. Pong;M.H. Tsai;Y.K. Chang;Y.Y. Chen;Y.F. Lee;P.K. Tseng;S.L. Wei;C.Y. Wen;L.C. Chen;K.H. Chen
國立中山大學	2001	X-ray absorption studies of carbon-related materials	W.F. Pong;C.L. Yueh;Y.D. Chang;M.H. Tsai;Y.K. Chang;Y.Y. Chen;J.F. Lee;S.L. Wei;C.Y. Wen;L.C. Chen;K.H. Chen;I.N. Lin;H.F. Cheng
國立中山大學	2001	Electronic and bonding structures of amorphous Si-C-N thin films by x-ray absorption spectroscopy	H.M. Tsai;J.C. Jan;J.W. Chiou;W.F. Pong;M.H. Tsai;Y.K. Chang;Y.Y. Chen;Y.W. Yang;L.J. Lai;J.J. Wu;C.T. Wu;K.H. Chen;L.C. Chen
國立臺灣海洋大學	2000-06-19	Mechanism of luminescence in InGaN/GaN multiple quantum wells	H. C. Yang;P. F. Kuo;T. Y. Lin;Y. F. Ch en;K. H. Chen;L. C. Chen;Jen-Inn Chyi
國立臺灣科技大學	2000	Effect of carbon sources on silicon carbon nitride films growth in an electron cyclotron resonance plasma chemical vapor deposition reactor	K.H. Chen;L.C. Chen;X.-J. Guo;S.T. Lin;E.-K. Lin;H.J. Lo;C.-W. Wang;C.Y. Wen;J.J. Wu;Y.-C. Yu
臺北醫學大學	2000	Finite element analysis of brain contusion: an indirect impact study	陳建志; Huang; H.M.; Lee; M.C.; Lee; S.Y.; Chiu; W.D.; Pan; L.C. Chen; C.T.
臺北醫學大學	2000	Finite element analysis of brain contusion: an indirect impact study	黃豪銘; Huang; H.M.; Lee; M.C.; Lee; S.Y.; Chiu; W.D.; Pan; L.C. Chen; C.T.
國立臺灣科技大學	1999	Ellipsometric Study of Carbon Nitride Thin Films with and without Silicon Addition	L. C. Chen;H. Y. Lin;C. S. Wong;K. H. Chen;S. T. Lin;Y. C. Yu;C. W. Wang;E. K. Lin

Showing items 76-85 of 87 (9 Page(s) Totally)
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