臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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	Repositories
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	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

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Institution	Date	Title	Author
臺大學術典藏	2018-09-10T15:36:25Z	A Continuous Compact Model Incorporating Higher-Order Correction for Junctionless Nanowire Tansistors with Arbitrary Doping Profiles	C Hong;L. Yang;Q. Cheng;T. Han;J. B. Kuo;Y. Chen; C Hong; L. Yang; Q. Cheng; T. Han; J. B. Kuo; Y. Chen; JAMES-B KUO
臺大學術典藏	2018-09-10T15:36:25Z	A Nonlinear Surface-Field Compact Model for Juinctionless Nanowire MOSFET	C. Hong;L. Yang;Q. Cheng;T. Han;J. B. Kuo;Y. Chen; C. Hong; L. Yang; Q. Cheng; T. Han; J. B. Kuo; Y. Chen; JAMES-B KUO
臺大學術典藏	2018-09-10T15:25:58Z	An Analytic Surface-Field-Based Quasi-Atomistic Model for Nanowire MOSFETs with Random Dopant Fluctuations	C. Hong;Q Cheng;P. Wang;L. Yang;Y. B. Kuo;Y. Chen; C. Hong; Q Cheng; P. Wang; L. Yang; Y. B. Kuo; Y. Chen; JAMES-B KUO
臺大學術典藏	2018-09-10T06:04:17Z	Supply Chain Inventory Control in Semiconductor Manufacturing	MING-HUANG CHIANG; RUEY-SHAN GUO; R. Guo; D. Chiang; L. Yang; K. Chuang; MING-HUANG CHIANG; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T06:04:16Z	Semiconductor Supply Chain Monitoring Schemes for Echelon WIP Inventory Using CONWIP Concept	RUEY-SHAN GUO;L. Yang;D. Chiang; RUEY-SHAN GUO; L. Yang; D. Chiang; RUEY-SHAN GUO
臺大學術典藏	2018-09-10T05:30:21Z	Semiconductor Supply Chain Monitoring Schemes for Echelon WIP Inventory	RUEY-SHAN GUO;J. Liou;L. Yang,;K. Chuang;D. Chiang; RUEY-SHAN GUO; J. Liou; L. Yang,; K. Chuang; D. Chiang; RUEY-SHAN GUO
美和科技大學	2013	Phytoremediation of soil contaminated by heavy oil with plants colonized by mycorrhizal fungi	H.-C. Kuo;D.-F. Juang;L. Yang;W.-C. Kuo;Y.-M. Wu
國立中山大學	2007	Iterative approximation to convex feasibility problems in Banach space	S.S. Chang;Jen-Chih Yao;J.K. Kim; L. Yang
臺大學術典藏	2006-12	Monitoring Semiconductor Supply Chain based on Echelon WIP Inventory and CONWIP System	D. Chiang; RUEY-SHAN GUO; L. Yang; RUEY-SHAN GUO; RUEY-SHAN GUO;L. Yang;D. Chiang
義守大學	2005-06	Copper position in type-I Ba8CU4Si42 clathrate	L. Yang;Y. Wang;T. Liu;T.D. Hu;B.X. Li;K. Ståhl;S.Y. Chen;M.Y. Li;P. Shen;G.L. Lu;Y.W. Wang;J.Z. Jiang

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