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"lai chao sung"的相关文件
显示项目 11-32 / 32 (共1页)
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| 國立交通大學 |
2017-04-21T06:49:10Z |
Dimensional Dependences of the Dynamic-NBTI with 1.2 nm N20-ISSG oxynitrides
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Lai, Chao Sung; Huang, D. C.; Chung, S. S. |
| 國立交通大學 |
2017-04-21T06:48:53Z |
Fluorinated HfO2 Gate Dielectrics Engineering for CMOS by pre- and post-CF4 Plasma Passivation
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Wu, Woei-Chemg; Lai, Chao-Sung; Lee, Shih-Ching; Ma, Ming-Wen; Chao, Tien-Sheng; Wang, Jer-Chyi; Hsu, Chih-Wei; Chou, Pai-Chi; Chen, Jian-Hao; Kao, Kuo-Hsing; Lo, Wen-Cheng; Lu, Tsung-Yi; Tay, Li-Lin; Rowell, Nelson |
| 國立交通大學 |
2014-12-08T15:30:25Z |
Passivation of yellow luminescence defects in GaN film by annealing and CF(4) plasma treatment
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Chen, Hsiang; Kao, Chyuan-Haur; Chen, Yi-Chen; Lo, Hong-Kai; Yeh, Yih-Min; Lu, Tien-Chang; Huang, Huei-Min; Lai, Chao-Sung |
| 國立交通大學 |
2014-12-08T15:22:53Z |
Growth of Large-Area and Highly Crystalline MoS2 Thin Layers on Insulating Substrates
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Liu, Keng-Ku; Zhang, Wenjing; Lee, Yi-Hsien; Lin, Yu-Chuan; Chang, Mu-Tung; Su, ChingYuan; Chang, Chia-Seng; Li, Hai; Shi, Yumeng; Zhang, Hua; Lai, Chao-Sung; Li, Lain-Jong |
| 國立交通大學 |
2014-12-08T15:17:51Z |
Polarity asymmetry of polyoxide grown on phosphorus in situ doped polysilicon
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Kao, Chyuan Haur; Lai, Chao Sung; Lee, Chung Len |
| 國立交通大學 |
2014-12-08T15:16:43Z |
A highly reliable multi-level and 2-bit/cell operation of wrapped-select-gate (WSG) SONOS memory with optimized ONO thickness
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Wu, Woei-Cherng; Chao, Tien-Sheng; Peng, Wu-Chin; Yang, Wen-Luh; Wang, Jer-Chyi; Chen, Jian-Hao; Ma, Ming-Wen; Lai, Chao-Sung; Yang, Tsung-Yu; Chen, Tzu-Ping; Chen, Chien-Hung; Lin, Chih-Hung; Chen, Hwi-Huang; Ko, Joe |
| 國立交通大學 |
2014-12-08T15:15:11Z |
Nitrogen effects on the integrity of silicon dioxide grown on polycrystalline silicon
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Lai, Chao Sung; Kao, Chyuan Haur; Lee, Chung Len; Lei, Tan Fu |
| 國立交通大學 |
2014-12-08T15:15:10Z |
Electrical and reliability improvement in polyoxide by fluorine implantation
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Kao, Chyuan Haur; Lai, Chao Sung; Lee, Chung Len |
| 國立交通大學 |
2014-12-08T15:15:05Z |
High-performance HfO2 gate dielectrics fluorinated by postdeposition CF4 plasma treatment
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Wu, Woei Cherng; Lai, Chao Sung; Wang, Jer Chyi; Chen, Jian Hao; Ma, Ming Wen; Chao, Tien Sheng |
| 國立交通大學 |
2014-12-08T15:14:34Z |
Highly reliable multilevel and 2-bit/cell operation of wrapped select gate (WSG) SONOS memory
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Wu, Woei-Cherng; Chao, Tien-Sheng; Peng, Wu-Chin; Yang, Wen-Luh; Wang, Jer-Chyi; Chen, Jian-Hao; Lai, Chao-Sung; Yang, Tsung-Yu; Lee, Chien-Hsing; Hsieh, Tsung-Min; Liou, Jhyy Cheng |
| 國立交通大學 |
2014-12-08T15:12:56Z |
Performance and interface characterization for contact etch stop layer-strained nMOSFET with HfO2 gate dielectrics under pulsed-IV measurement
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Wu, Woei-Cherng; Chao, Tien-Sheng; Chiu, Te-Hsin; Wang, Jer-Chyi; Lai, Chao-Sung; Ma, Ming-Wen; Lo, Wen-Cheng |
| 國立交通大學 |
2014-12-08T15:12:55Z |
Optimized ONO thickness for multi-level and 2-bit/cell operation for wrapped-select-gate (WSG) SONOS memory
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Wu, Woei-Cherng; Chao, Tien-Sheng; Peng, Wu-Chin; Yang, Wen-Luh; Chen, Jian-Hao; Ma, Ming Wen; Lai, Chao-Sung; Yang, Tsung-Yu; Lee, Chien-Hsing; Hsieh, Tsung-Min; Liou, Jhyy Cheng; Chen, Tzu Ping; Chen, Chien Hung; Lin, Chih Hung; Chen, Hwi Huang; Ko, Joe |
| 國立交通大學 |
2014-12-08T15:12:52Z |
Current transport mechanism for HfO2 gate dielectrics with fluorine incorporation
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Wu, Woei Cherng; Lai, Chao Sung; Wang, Tzu Ming; Wang, Jer Chyi; Hsu, Chih Wei; Ma, Ming Wen; Chao, Tien Sheng |
| 國立交通大學 |
2014-12-08T15:11:13Z |
Carrier transportation mechanism of the TaN/HfO(2)/IL/Si structure with silicon surface fluorine implantation
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Wu, Woei Cherng; Lai, Chao-Sung; Wang, Tzu-Ming; Wang, Jer-Chyi; Hsu, Chih Wei; Ma, Ming Wen; Lo, Wen-Cheng; Chao, Tien Sheng |
| 國立交通大學 |
2014-12-08T15:10:35Z |
Positive Bias Temperature Instability (PBTI) Characteristics of Contact-Etch-Stop-Layer-Induced Local-Tensile-Strained HfO(2) nMOSFET
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Wu, Woei-Cherng; Chao, Tien-Sheng; Chiu, Te-Hsin; Wang, Jer-Chyi; Lai, Chao-Sung; Ma, Ming-Wen; Lo, Wen-Cheng |
| 國立交通大學 |
2014-12-08T15:07:34Z |
Performance enhancement for strained HfO(2) nMOSFET with contact etch stop layer (CESL) under pulsed-IV measurement
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Wu, Woei-Cherng; Chao, Tien-Sheng; Chiu, Te-Hsin; Wang, Jer-Chyi; Lai, Chao-Sung; Ma, Ming-Wen; Lo, Wen-Cheng; Ho, Yi-Hsun |
| 國立交通大學 |
2014-12-08T15:02:15Z |
The polarity dependence of ONO thickness for wrapped-select-gate (WSG) SONOS memory
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Wang, Kuan-Ti; Chao, Tien-Sheng; Wu, Woei-Cherng; Lai, Chao-Sung |
| 國立成功大學 |
2012-06-30 |
Microstructural effect of gadolinium oxide nanocrystals upon annealing on electrical properties of memory devices
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Huang, Michael R. S.; Liu, Chuan-Pu; Wang, Jer-Chyi; Chen, Yu-Kai; Lai, Chao-Sung; Fang, Yu-Ching; Shu, Li |
| 國立臺灣大學 |
2012 |
Formation polarity dependent improved resistive switching memory characteristics using nanoscale (1.3 nm) core-shell IrOx nano-dots
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Banerjee, Writam; Maikap, Siddheswar; Lai, Chao-Sung; Chen, Yi-Yan; Tien, Ta-Chang; Lee, Heng-Yuan; Chen, Wei-Su; Chen, Frederick T.; Kao, Ming-Jer; Tsai, Ming-Jinn; Yang, Jer-Ren |
| 臺大學術典藏 |
2012 |
Formation polarity dependent improved resistive switching memory characteristics using nanoscale (1.3 nm) core-shell IrOx nano-dots
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Yang, Jer-Ren et al.; Banerjee, Writam; Banerjee, Writam; Maikap, Siddheswar; Lai, Chao-Sung; Chen, Yi-Yan; Tien, Ta-Chang; Lee, Heng-Yuan; Chen, Wei-Su; Chen, Frederick T.; Kao, Ming-Jer; Tsai, Ming-Jinn; Yang, Jer-Ren |
| 東海大學 |
2010 |
離子感測器EIS之積體化量測系統(I)
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黃宇中,賴朝松; Huang, Yu-Chung; Lai, Chao-Sung |
| 國立成功大學 |
2009 |
Characteristics of Gadolinium Oxide Nanocrystal Memory with Optimized Rapid Thermal Annealing
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Wang, Jer-Chyi; Lai, Chao-Sung; Chen, Yu-Kai; Lin, Chih-Ting; Liu, Chuan-Pu; Huang, Michael R. S.; Fang, Yu-Ching |
显示项目 11-32 / 32 (共1页)
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