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Taiwan Academic Institutional Repository >
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"lai chien ming"
Showing items 11-20 of 23 (3 Page(s) Totally)
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| 國立成功大學 |
2014-08-11 |
Investigation of trap properties in high-k/metal gate p-type metal-oxide-semiconductor field-effect-transistors with aluminum ion implantation using random telegraph noise analysis
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Kao, Tsung-Hsien; Chang, Shoou-Jinn; Fang, Yean-Kuen; Huang, Po-Chin; Lai, Chien-Ming; Hsu, Chia-Wei; Chen, Yi-Wen; Cheng, Osbert; Wu, Chung-Yi; Wu, San-Lein |
| 國立成功大學 |
2014-07-29 |
壓電致動器驅動油壓控制閥設計與控制之研究
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賴建名; Lai, Chien-Ming |
| 國立成功大學 |
2014-04 |
Trap properties of high-k/metal gate pMOSFETs with aluminum ion implantation by random telegraph noise and 1/f noise measurements
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Kao, Tsung-Hsien; Wu, San-Lein; Tsai, Kai-Shiang; Fang, Yean-Kuen; Lai, Chien-Ming; Hsu, Chia-Wei; Chen, Yi-Wen; Cheng, Osbert; Chang, Shoou-Jinn |
| 國立臺灣大學 |
2014 |
建立日日春與CrPR1a及CrLOX2相關之轉錄因子調控網絡
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賴建閔; Lai, Chien-Ming |
| 國立成功大學 |
2013-07 |
Low-Frequency Noise Characteristics for Various ZrO2-Added HfO2-Based 28-nm High-k/Metal-Gate nMOSFETs
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Tsai, Shih Chang; Wu, San Lein; Wang, Bo Chin; Chang, Shoou Jinn; Hsu, Che Hua; Yang, Chih Wei; Lai, Chien Ming; Hsu, Chia Wei; Cheng, Osbert; Huang, Po Chin; Chen, Jone F. |
| 國立成功大學 |
2013-04 |
Effect of Annealing Process on Trap Properties in High-k/Metal Gate n-Channel Metal-Oxide-Semiconductor Field-Effect Transistors through Low-Frequency Noise and Random Telegraph Noise Characterization
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Chiu, Hsu Feng; Wu, San Lein; Chang, Yee Shyi; Chang, Shoou Jinn; Huang, Po Chin; Chen, Jone Fang; Tsai, Shih Chang; Lai, Chien Ming; Hsu, Chia Wei; Cheng, Osbert |
| 國立成功大學 |
2012-09-17 |
Impact of oxygen annealing on high-k gate stack defects characterized by random telegraph noise
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Chiu, Hsu Feng; Wu, San Lein; Chang, Yee Shyi; Chang, Shoou Jinn; Chen, Jone Fang; Tsai, Shih Chang; Hsu, Che Hua; Lai, Chien Ming; Hsu, Chia Wei; Cheng, Osbert |
| 國立高雄大學 |
2010 |
Improvement of TDDB reliability, characteristics of HfO2 high-k/metal gate MOSFET device with oxygen post deposition annealing
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Hsu, Chia-Wei; Fang, Yean-Kuen; Yeh, Wen-Kuan; Chen, Chun-Yu; Chiang, Yen-Ting; Juang, Feng-Renn; Lin, Chien-Ting; Lai, Chien-Ming |
| 國立高雄大學 |
2009-07 |
Effect of Nitrogen Incorporation in a Gd Cap Layer on the Reliability of Deep-Submicrometer Hf-Based High-k/Metal-Gate nMOSFETs
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Hsu, Chia-Wei; Fang, Yean-Kuen; Yeh, Wen-Kuan; Chen, Chun-Yu; Lin, Chien-Ting; Hsu, Che-Hua; Cheng, Li-Wei; Lai, Chien-Ming |
| 國立成功大學 |
2009-07 |
Effect of Nitrogen Incorporation in a Gd Cap Layer on the Reliability of Deep-Submicrometer Hf-Based High-k/Metal-Gate nMOSFETs
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Hsu, Chia-Wei; Fang, Yean-Kuen; Yeh, Wen-Kuan; Chen, Chun-Yu; Lin, Chien-Ting; Hsu, Che-Hua; Cheng, Li-Wei; Lai, Chien-Ming |
Showing items 11-20 of 23 (3 Page(s) Totally)
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