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机构 日期 题名 作者
國立臺灣科技大學 2007 Dependence of ferroelectric characteristics on the deposition temperature of (Pb,Sr)TiO3 films Wang, Jyh-Liang; Lai, Yi-Sheng; Shye, Der-Chi; Chou, Chen-Chia; Chiou, Bi-Shiou; Juan, Chun-Ping; Cheng, Huang-Chung
國立成功大學 2006-09-18 Dependence of crystal structure and work function of WNx films on the nitrogen content Jiang, Pei-Chuen; Lai, Yi-Sheng; Chen, Jen-Sue
國立成功大學 2006-06 Charge-transport characteristics in bistable resistive poly (N-vinylcarbazole) films Lai, Yi-Sheng; Tu, Chia-Hsun; Kwong, Dim-Lee; Chen, Jen-Sue
國立高雄應用科技大學 2006-03 Exploring the sheet resistance variation with various beam current densities in low-energy ion implantation Lai, Yi-Sheng;Chen, J.S.;Sun, H.L.;Chen, Z.B.;Tien, C.T.;Yeh, S.Y.;Chen, C.W.;Lee, F.S.;Ho, Y.S.;Hsu, P.Y.;Wu, H.H.;Wang, J.H.;Yang, C.M.
國立成功大學 2006 Influence of nitrogen content in WNx on its thermal stability and electrical property as a gate electrode Jiang, Pei-Chuen; Lai, Yi-Sheng; Chen, Jen-Sue
國立成功大學 2006 Investigation of the Hf-based gate dielectrics deposited by reactive sputtering in oxygen or nitrogen atmosphere Lu, Cheng-Hsueh; Lai, Yi-Sheng; Chen, J. S.
國立成功大學 2005-11 Compositional tailored sol-gel SiO2-TiO2 thin films: Crystallization, chemical bonding configuration, and optical properties Yang, Li-Lan; Lai, Yi-Sheng; Chen, Jen-Sue; Tsai, P. H.; Chen, C. L.; Chang, C. Jason
國立成功大學 2005-09-22 Effect of heat treatment on the properties of non-stoichiometric p-type nickel oxide films deposited by reactive sputtering Yang, Jiin-Long; Lai, Yi-Sheng; Chen, Jen-Sue
國立成功大學 2005-09-19 Bistable resistance switching of poly(N-vinylcarbazole) films for nonvolatile memory applications Lai, Yi-Sheng; Tu, Chia-Hsun; Kwong, Dim-Lee; Chen, Jen-Sue
國立成功大學 2005 Comparison of thermal stability and chemical bonding configurations of plasma oxynitrided Hf and Zr thin films Lai, Yi-Sheng; Lu, C. H.; Chen, Li-Min; Chen, Jen-Sue
國立成功大學 2005 Energy dependence of radiation damage in Sb-implanted Si(100) Lai, Yi-Sheng; Chen, Jen-Sue; Ho, Y. S.; Sun, H. L.; Tsai, C. J.; Chen, T. C.; Ko, Y. F.; Lee, F. S.; You, W. M.
國立成功大學 2004 Interlayer growth and electrical behavior of Ta2O5/SiOxNy/Si gate stacks Lai, Yi-Sheng; Chen, Jen-Sue; Wang, J. L.
國立成功大學 2003-05-30 超薄氮氧化矽作為五氧化二鉭閘極氧化層之中介層特性研究 賴宜生; Lai, Yi-Sheng
國立成功大學 2003-05-30 超薄氮氧化矽作為五氧化二鉭閘極氧化層之中介層特性研究 賴宜生; Lai, Yi-Sheng
國立成功大學 2003-05 Evolution of chemical bonding configuration in ultrathin SiOxNy layers grown by low-temperature plasma nitridation Lai, Yi-Sheng; Chen, Jen-Sue
國立成功大學 2002-12-02 Spectroscopic ellipsometry study on the structure of Ta2O5/SiOxNy/Si gate dielectric stacks Lai, Yi-Sheng; Chen, Jen-Sue
國立成功大學 2002-07 Effects of plasma prenitridation and postdeposition annealing on the structural and dielectric characteristics of the Ta2O5/Si system Lai, Yi-Sheng; Chen, Kuan-Jen; Chen, Jen-Sue
國立成功大學 2002-05-15 Investigation of the interlayer characteristics of Ta2O5 thin films deposited on bare, N2O, and NH3 plasma nitridated Si substrates Lai, Yi-Sheng; Chen, Kuan-Jen; Chen, Jen-Sue
國立成功大學 2001-07 Characterization of tantalum pentoxide dielectric films grown by low-pressure and plasma-enhanced chemical vapor deposition Lai, Yi-Sheng; Chen, Jen-Sue
國立成功大學 2001-07 Comparison of dielectric characteristics of Ta2O5 thin films on RuO2 and Ru bottom electrodes Huang, J. H.; Lai, Yi-Sheng; Chen, Jen-Sue

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