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Showing items 1-5 of 5 (1 Page(s) Totally)
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| 臺大學術典藏 |
2018-09-10T05:58:47Z |
Abnormal trend detection of sequence-disordered data using EWMA method
|
Fan, Jr-Min;Guo, Ruey-Shan;Chang, Shi-Chung;Lee, Jian-Huei; Fan, Jr-Min; Guo, Ruey-Shan; Chang, Shi-Chung; Lee, Jian-Huei; SHI-CHUNG CHANG |
| 臺大學術典藏 |
2018-09-10T05:58:46Z |
Intelligent process diagnosis based on end-of-line electrical test data
|
Guo, Ruey-Shan;Tsai, Cheng-Kai;Lee, Jian-Huei;Chang, Shi-Chung; Guo, Ruey-Shan; Tsai, Cheng-Kai; Lee, Jian-Huei; Chang, Shi-Chung; SHI-CHUNG CHANG |
| 國立臺灣大學 |
1996-11 |
Abnormal trend detection of sequence-disordered data using EWMA method [wafer fabrication]
|
Fan, Jr-Min; Guo, Ruey-Shan; Chang, Shi-Chung; Lee, Jian-Huei |
| 臺大學術典藏 |
1996-11 |
Abnormal trend detection of sequence-disordered data using EWMA method [wafer fabrication]
|
Fan, Jr-Min; Guo, Ruey-Shan; Chang, Shi-Chung; Lee, Jian-Huei; Fan, Jr-Min; Guo, Ruey-Shan; Chang, Shi-Chung; Lee, Jian-Huei |
| 國立臺灣大學 |
1996-10 |
Intelligent process diagnosis based on end-of-line electrical test data
|
Guo, Ruey-Shan; Tsai, Cheng-Kai; Lee, Jian-Huei; Chang, Shi-Chung |
Showing items 1-5 of 5 (1 Page(s) Totally)
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