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國立交通大學 |
2014-12-08T15:37:01Z |
Stress migration and electromigration improvement for copper dual damascene interconnection
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Wang, TC; Hsieh, TE; Wang, MT; Su, DS; Chang, CH; Wang, YL; Lee, JYM |
國立交通大學 |
2014-12-08T15:03:55Z |
GROWTH-BEHAVIOR OF Y1BA2CU3O7-X SUPERCONDUCTING THIN-FILMS USING LASER-ABLATION TECHNIQUE
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HUANG, CS; LIN, IN; LEE, JYM; TSENG, TY |
Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
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