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Showing items 1-4 of 4 (1 Page(s) Totally)
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| 國立交通大學 |
2019-04-02T06:00:47Z |
A Model-Based-Random-Forest Framework for Predicting V-t Mean and Variance Based on Parallel I-d Measurement
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Lin, Chien-Hsueh; Tsai, Chih-Ying; Lee, Kao-Chi; Yu, Sung-Chu; Liau, Wen-Rong; Hou, Alex Chun-Liang; Chen, Ying-Yen; Kuo, Chun-Yi; Lee, Jih-Nung; Chao, Mango C. T. |
| 國立交通大學 |
2018-08-21T05:56:46Z |
Fast WAT Test Structure for Measuring Vt Variance Based on Latch-based Comparators
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Lee, Kao-Chi; Wu, Kai-Chiang; Tsai, Chih-Ying; Chao, Mango Chia-Tso |
| 國立交通大學 |
2017-04-21T06:49:37Z |
Predicting V-t Mean and Variance from Parallel I-d Measurement with Model-Fitting Technique
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Tsai, Chih-Ying; Lee, Kao-Chi; Lin, Chien-Hsueh; Yu, Sung-Chu; Liau, Wen-Rong; Hou, Alex Chun-Liang; Chen, Ying-Yen; Kuo, Chun-Yi; Lee, Jih-Nung; Chao, Mango C. -T. |
| 國立交通大學 |
2015-11-26T01:02:54Z |
使用閂鎖比較器快速量測臨界電壓變異數之 WAT測試電路
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李高騏; Lee, Kao-Chi; 趙家佐; Chao, Chia-Tso |
Showing items 1-4 of 4 (1 Page(s) Totally)
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