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| 臺大學術典藏 |
2021-03-03T10:26:41Z |
Analysis and experimental evaluation of mechanical errors in nine-link type double-toggle mold/die clamping mechanisms
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Chang, Wen Tung; Lee, Wei I.; KUAN-LUN HSU |
| 國立交通大學 |
2019-04-03T06:41:31Z |
Controlling bottom-up rapid growth of single crystalline gallium nitride nanowires on silicon
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Wu, Ko-Li; Chou, Yi; Su, Chang-Chou; Yang, Chih-Chaing; Lee, Wei-I.; Chou, Yi-Chia |
| 國立交通大學 |
2019-04-03T06:38:24Z |
High-efficiency and low assembly-dependent chip-scale package for white light-emitting diodes
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Huang, Che-Hsuan; Chen, Kuo-Ju; Tsai, Ming-Ta; Shih, Min-Hsiung; Sun, Chia-Wei; Lee, Wei-I; Lin, Chien-Chung; Kuo, Hao Chung |
| 國立交通大學 |
2019-04-02T06:00:19Z |
Structure and Strain Relaxation of GaN Nanorods Grown on Homoepitaxial Surface via Controlling Irregular Mask
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Huang, Chang-Hsun; Pakzad, Anahita; Lee, Wei-I; Chou, Yi-Chia |
| 國立交通大學 |
2018-08-21T05:53:54Z |
The effect of the flipped classroom approach to OpenCourseWare instruction on students' self-regulation
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Sun, Jerry Chih-Yuan; Wu, Yu-Ting; Lee, Wei-I |
| 國立交通大學 |
2018-08-21T05:53:09Z |
Microscopic evidence for the dissociation of water molecules on cleaved GaN(1(1)over bar00)
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Wu, Shih-Yu; Lang, Liang-Wei; Cai, Pei-Yang; Chen, Yun-Wen; Lai, Yu-Ling; Lin, Ming-Wei; Hsu, Yao-Jane; Lee, Wei-I; Kuo, Jer-Lai; Luo, Meng-Fan; Kuo, Chien-Cheng |
| 國立交通大學 |
2018-01-24T07:41:54Z |
複合高介電係數閘極介電層在三五族半導體中之缺陷特性及其可靠度研究
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曲崇銘; 李威儀; Chu, Chung-Ming; Lee, Wei-I |
| 國立交通大學 |
2017-04-21T06:55:56Z |
Au-Free GaN High-Electron-Mobility Transistor with Ti/Al/W Ohmic and WN (X) Schottky Metal Structures for High-Power Applications
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Hsieh, Ting-En; Lin, Yueh-Chin; Chu, Chung-Ming; Chuang, Yu-Lin; Huang, Yu-Xiang; Shi, Wang-Cheng; Dee, Chang-Fu; Majlis, Burhanuddin Yeop; Lee, Wei-I; Chang, Edward Yi |
| 國立交通大學 |
2017-04-21T06:55:49Z |
Investigations of GaN growth on the sapphire substrate by MOCVD method with different AlN buffer deposition temperatures
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Huang, Wei-Ching; Chu, Chung-Ming; Wong, Yuen Yee; Chen, Kai-Wei; Lin, Yen-Ku; Wu, Chia-Hsun; Lee, Wei-I; Chang, Edward-Yi |
| 國立交通大學 |
2017-04-21T06:55:41Z |
Reliability study of high-k La2O3/HfO2 and HfO2/La2O3 stacking layers on n-In0.53Ga0.47As metal-oxide-semiconductor capacitor
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Chu, Chung-Ming; Lin, Yueh-Chin; Lee, Wei-I; Dee, Chang Fu; Wong, Yuen-Yee; Majlis, Burhanuddin Yeop; Salleh, Muhamad Mat; Yap, Seong Ling; Chang, Edward Yi |
Showing items 1-10 of 104 (11 Page(s) Totally)
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