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Institution Date Title Author
臺大學術典藏 2021-03-03T10:26:41Z Analysis and experimental evaluation of mechanical errors in nine-link type double-toggle mold/die clamping mechanisms Chang, Wen Tung; Lee, Wei I.; KUAN-LUN HSU
國立交通大學 2019-04-03T06:41:31Z Controlling bottom-up rapid growth of single crystalline gallium nitride nanowires on silicon Wu, Ko-Li; Chou, Yi; Su, Chang-Chou; Yang, Chih-Chaing; Lee, Wei-I.; Chou, Yi-Chia
國立交通大學 2019-04-03T06:38:24Z High-efficiency and low assembly-dependent chip-scale package for white light-emitting diodes Huang, Che-Hsuan; Chen, Kuo-Ju; Tsai, Ming-Ta; Shih, Min-Hsiung; Sun, Chia-Wei; Lee, Wei-I; Lin, Chien-Chung; Kuo, Hao Chung
國立交通大學 2019-04-02T06:00:19Z Structure and Strain Relaxation of GaN Nanorods Grown on Homoepitaxial Surface via Controlling Irregular Mask Huang, Chang-Hsun; Pakzad, Anahita; Lee, Wei-I; Chou, Yi-Chia
國立交通大學 2018-08-21T05:53:54Z The effect of the flipped classroom approach to OpenCourseWare instruction on students' self-regulation Sun, Jerry Chih-Yuan; Wu, Yu-Ting; Lee, Wei-I
國立交通大學 2018-08-21T05:53:09Z Microscopic evidence for the dissociation of water molecules on cleaved GaN(1(1)over bar00) Wu, Shih-Yu; Lang, Liang-Wei; Cai, Pei-Yang; Chen, Yun-Wen; Lai, Yu-Ling; Lin, Ming-Wei; Hsu, Yao-Jane; Lee, Wei-I; Kuo, Jer-Lai; Luo, Meng-Fan; Kuo, Chien-Cheng
國立交通大學 2018-01-24T07:41:54Z 複合高介電係數閘極介電層在三五族半導體中之缺陷特性及其可靠度研究 曲崇銘; 李威儀; Chu, Chung-Ming; Lee, Wei-I
國立交通大學 2017-04-21T06:55:56Z Au-Free GaN High-Electron-Mobility Transistor with Ti/Al/W Ohmic and WN (X) Schottky Metal Structures for High-Power Applications Hsieh, Ting-En; Lin, Yueh-Chin; Chu, Chung-Ming; Chuang, Yu-Lin; Huang, Yu-Xiang; Shi, Wang-Cheng; Dee, Chang-Fu; Majlis, Burhanuddin Yeop; Lee, Wei-I; Chang, Edward Yi
國立交通大學 2017-04-21T06:55:49Z Investigations of GaN growth on the sapphire substrate by MOCVD method with different AlN buffer deposition temperatures Huang, Wei-Ching; Chu, Chung-Ming; Wong, Yuen Yee; Chen, Kai-Wei; Lin, Yen-Ku; Wu, Chia-Hsun; Lee, Wei-I; Chang, Edward-Yi
國立交通大學 2017-04-21T06:55:41Z Reliability study of high-k La2O3/HfO2 and HfO2/La2O3 stacking layers on n-In0.53Ga0.47As metal-oxide-semiconductor capacitor Chu, Chung-Ming; Lin, Yueh-Chin; Lee, Wei-I; Dee, Chang Fu; Wong, Yuen-Yee; Majlis, Burhanuddin Yeop; Salleh, Muhamad Mat; Yap, Seong Ling; Chang, Edward Yi

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