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Taiwan Academic Institutional Repository >
Browse by Author
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"lee yao jen"
Showing items 71-80 of 99 (10 Page(s) Totally) << < 1 2 3 4 5 6 7 8 9 10 > >> View [10|25|50] records per page
| 國立交通大學 |
2014-12-08T15:28:19Z |
Effects of microwave annealing on electrical enhancement of amorphous oxide semiconductor thin film transistor
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Teng, Li-Feng; Liu, Po-Tsun; Lo, Yuan-Jou; Lee, Yao-Jen |
| 國立交通大學 |
2014-12-08T15:24:06Z |
Low-Temperature Microwave Annealing Process for Dopant Activation and Thermal Stability of TiN Material
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Tsai, Bo-An; Lai, Chiung-Hui; Lee, Bo-Shiun; Luo, Chih-Wei; Lee, Yao-Jen |
| 國立交通大學 |
2014-12-08T15:21:25Z |
Susceptor Coupling for the Uniformity and Dopant Activation Efficiency in Implanted Si Under Fixed-Frequency Microwave Anneal
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Lee, Yao-Jen; Hsueh, Fu-Kuo; Current, Michael I.; Wu, Ching-Yi; Chao, Tien-Sheng |
| 國立交通大學 |
2014-12-08T15:16:26Z |
Trap-state density in continuous-wave laser-crystallized single-grainlike silicon transistors
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Lin, Yu-Ting; Chen, Chih; Shieh, Jia-Min; Lee, Yao-Jen; Pan, Ci-Ling; Cheng, Ching-Wei; Peng, Jian-Ten; Chao, Chih-Wei |
| 國立交通大學 |
2014-12-08T15:16:17Z |
Impacts of precursor flow rate and temperature of PECVD-SiN capping films on strained-channel NMOSFETs
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Lu, Ching-Sen; Lin, Horng-Chih; Lee, Yao-Jen; Huang, Tiao-Yuan |
| 國立交通大學 |
2014-12-08T15:16:15Z |
Spatially resolving the degradation of SPC thin-film transistors under AC stress
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Chang, Kai-Hsiang; Lee, Ming-Hsien; Lin, Horng-Chih; Huang, Tiao-Yuan; Lee, Yao-Jen |
| 國立交通大學 |
2014-12-08T15:15:10Z |
Improvement of negative-bias-temperature instability in SiN-capped p-channel metal-oxide-semiconductor field-effect transistors using ultrathin HfO2 buffer layer
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Lu, Ching-Sen; Horng-Chih, Lin; Lee, Yao-Jen |
| 國立交通大學 |
2014-12-08T15:14:38Z |
Impacts of SiN-capping layer on the device characteristics and hot-carrier degradation of nMOSFETs
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Lu, Chia-Yu; Lin, Horng-Chih; Lee, Yao-Jen; Shie, Yu-Lin; Chao, Chih-Cheng |
| 國立交通大學 |
2014-12-08T15:14:29Z |
Impacts of a polycrystalline-silicon buffer layer on the performance and reliability of strained n-channel metal-oxide-semiconductor field-effect transistors with SiN capping
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Lu, Ching-Sen; Lin, Horng-Chih; Huang, Jian-Ming; Lee, Yao-Jen |
| 國立交通大學 |
2014-12-08T15:13:28Z |
Performance enhancement by local strain in (110) channel n-channel metal-oxide-semicondiactor field-effect transistors on (111) substrate
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Lo, Wen-Cheng; Ku, Ya-Hsin; Lee, Yao-Jen; Chao, Tien-Sheng; Chang, Chun-Yen |
Showing items 71-80 of 99 (10 Page(s) Totally) << < 1 2 3 4 5 6 7 8 9 10 > >> View [10|25|50] records per page
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