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| 國立交通大學 |
2018-08-21T05:54:27Z |
Device Instability of ReRAM and a Novel Reference Cell Design for Wide Temperature Range Operation
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Lin, Y. H.; Lin, Y. Y.; Lee, F. M.; Ho, Y. H.; Hsu, K. C.; Lee, M. H.; Lee, D. Y.; Chiang, K. H.; Yang, C. C.; Li, C. H.; Wu, S. W.; Lei, C. Y.; Lin, C. M.; Chen, C. J.; Chen, K. H.; Lung, H. L.; Wang, K. C.; Tseng, T. Y.; Lu, C. Y. |
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