| 國立交通大學 |
2014-12-13T10:29:57Z |
新式低溫複晶矽薄膜電晶體之結構與技術在電抹除可程式唯讀記憶體的應用(II)
|
雷添福; LEI TAN-FU |
| 國立交通大學 |
2014-12-13T10:29:23Z |
高介電常數奈米微晶粒材料之研究與記憶體元件之製作(II)
|
雷添福; LEI TAN-FU |
| 國立交通大學 |
2014-12-13T10:28:31Z |
高介電常數奈米微晶粒材料之研究與記憶體元件之製作(III)
|
雷添福; LEI TAN-FU |
| 國立交通大學 |
2014-12-13T10:28:26Z |
新式低溫複晶矽薄膜電晶體之結構與技術在電抹除可程式唯讀記憶體的應用(III)
|
雷添福; LEI TAN-FU |
| 國立交通大學 |
2014-12-12T03:02:11Z |
利用溶膠法探討不同溶液製備之鉿金屬氧化層經不同退火溫度處理之特性
|
劉伊容; Liu, Yi-Jung; 雷添福; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-12T02:43:10Z |
利用單電晶體之多位元電阻式記憶體於低成本嵌入式應用
|
吳仕傑; Wu, Shih-Chieh; 侯拓宏; 雷添福; Hou, Tuo-Hung; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-12T02:38:34Z |
電阻式記憶體寫入速度及干擾困境之統計研究及快速預測方法
|
羅文呈; Luo, Wun-Cheng; 侯拓宏; 雷添福; Hou, Tuo-Hung; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-12T02:30:38Z |
利用氟氮摻雜與低溫電漿處理在奈米金氧半電晶體元件製程上的應用
|
張子云; Chang Tzu Tun; 雷添福; Lei Tan Fu |
| 國立交通大學 |
2014-12-12T02:25:33Z |
Ti/NiSi/Si及TiN/NiSi/Si堆疊結構
|
陳朝欽; Chen Chao-Chin; 雷添福; Lei Tan-Fu |
| 國立交通大學 |
2014-12-12T02:17:36Z |
晶片表面潔淨與閘極結構對閘極氧化層影響之研究
|
何樂群; Ho, Leh_Chyung; 雷添福; Lei Tan-Fu |
| 國立交通大學 |
2014-12-12T02:17:33Z |
矽化鈦閘極結構對薄閘極氧化層的影響
|
楊鐙祺; Yang, Dan-Chi; 雷添福; Lei Tan-Fu |
| 國立交通大學 |
2014-12-12T02:17:32Z |
磁場感測器之研究
|
陳怡如; Chen, Yi-Ru; 雷添福; Lei Tan-Fu |
| 國立交通大學 |
2014-12-12T02:17:28Z |
探討晶片表面潔淨與閘極結構對閘極氧化層之影響
|
何樂群; Ho, Leh_Chyung; 雷添福; Lei Tan-Fu |
| 國立交通大學 |
2014-12-12T02:17:28Z |
低溫化複晶矽氧化層之製程及其在穿隧氧化層之影響
|
陳鴻祺; Chen, Hong-Chi; 雷添福; Lei Tan-Fu |
| 國立交通大學 |
2014-12-12T02:16:09Z |
閘極氧化層可靠性之分析與應用於表面通道P型金氧半場效電晶體之閘極工程
|
林永豪; Lin, Yung-Hao; 李崇仁; 雷添福; Lee, Chung-Len; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-12T02:15:32Z |
以Si2H6低壓氣相沉積之複晶矽研製低溫 (<=600℃)薄膜電晶體
|
張正佶; Chang, Cheng-Jyi; 雷添福; Lei Tan-Fu |
| 國立交通大學 |
2014-12-12T01:31:37Z |
鈰金屬,鉿金屬閘極絕緣層及複晶矽氮氧化層之研究
|
江國誠; KUO CHENG CHIANG.; 雷添福; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-12T01:24:29Z |
非揮發性二氧化鉿電阻式記憶體之研究
|
林冠良; Lin, Kuan-Liang; 雷添福; 侯拓宏; Lei, Tan-Fu; Hou, Tuo-Hung |
| 國立交通大學 |
2014-12-12T01:22:35Z |
應用於高密度資料儲存與軟性電子之交錯電阻式記憶體
|
黃俊嘉; Huang, Jiun-Jia; 侯拓宏; 雷添福; Hou, Tuo-Hung; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:49:10Z |
Spacer technique to fabricate pSi TFTs with 50nm nanowire channels
|
Chang, Chia-Wen; Chen, Szu-Fen; Wu, Shih-Chieh; Lin, Guan-Liang; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:44:27Z |
Improvement on performance and reliability of TaN/HfO2 LTPS-TFTs with fluorine implantation
|
Ma, Ming-Wen; Chen, Chih-Yang; Su, Chun-Jung; Wu, Woei-Cherng; Yang, Tsung-Yu; Kao, Kuo-Hsing; Chao, Tien-Sheng; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:44:21Z |
High-performance solid-phase crystallized polycrystalline silicon thin-film transistors with floating-channel structure
|
Chang, Chia-Wen; Deng, Chih-Kang; Chang, Che-Lun; Liao, Ta-Chuan; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:33:38Z |
Reversible transition of resistive switching induced by oxygen-vacancy and metal filaments in HfO2
|
Luo, Wun-Cheng; Hou, Tuo-Hung; Lin, Kuan-Liang; Lee, Yao-Jen; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:29:52Z |
Switching Mode and Mechanism in Binary Oxide Resistive Random Access Memory Using Ni Electrode
|
Lin, Kuan-Liang; Hou, Tuo-Hung; Lee, Yao-Jen; Chang, Jhe-Wei; Lin, Jun-Hung; Shieh, Jiann; Chou, Cheng-Tung; Lei, Tan-Fu; Chang, Wen-Hsiung; Jang, Wen-Yueh; Lin, Chen-Hsi |
| 國立交通大學 |
2014-12-08T15:28:10Z |
Polycrystalline silicon thin-film transistor with nickel-titanium oxide by sol-gel spin-coating and nitrogen implantation
|
Wu, Shih-Chieh; Hou, Tuo-Hung; Chuang, Shiow-Huey; Chou, Hsin-Chih; Chao, Tien-Sheng; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:25:30Z |
Analysis of pentacene thin film transistors in different atmospheres
|
Wang, Yu-Wu; Cheng, Horng-Long; Wang, Yi-Kai; Hu, Tang-Hsiang; Ho, Jia-Chong; Lee, Cheng-Chung; Lei, Tan-Fu; Yeh, Ching-Fa |
| 國立交通大學 |
2014-12-08T15:25:06Z |
Effect of chemical mechanical polish process on low-temperature poly-SiGe thin-film transistors
|
Shieh, Ming-Shan; Chen, Chih-Yang; Hsu, Yuan-Jiun; Wang, Shen-De; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:25:06Z |
Process induced instability and reliability issues in low temperature poly-Si thin film transistors
|
Chen, Chih-Yang; Wang, Shen-De; Shieh, Ming-Shan; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Lee, Jam-Wen; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:17:43Z |
PolySi-SiO2-ZrO2-SiO2-Si flash memory incorporating a sol-gel-derived ZrO2 charge trapping layer
|
Hsu, Tzu-Hsiang; You, Hsin-Chiang; Ko, Fu-Hsiang; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:16:08Z |
Hafnium silicate nanocrystal memory using sol-gel-spin-coating method
|
You, Hsin-Chiang; Hsu, Tze-Hsiang; Ko, Fu-Hsiang; Huang, Jiang-Wen; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:16:08Z |
SONOS-type flash memory using an HfO2 as a charge trapping layer deposited by the sol-gel spin-coating method
|
You, Hsin-Chiang; Hsu, Tze-Hsiang; Ko, Fu-Hsiang; Huang, Jiang-Wen; Yang, Wen-Luh; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:57Z |
Fringing electric field effect on 65-nm-node fully depleted silicon-on-insulator devices
|
Ma, Ming-Wen; Chao, Tien-Sheng; Kao, Kuo-Hsing; Huang, Jyun-Siang; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:43Z |
The impact of deep Ni salicidation and NH3 plasma treatment on nano-SOI FinFETs
|
You, Hsin-Chiang; Kuo, Po-Yi; Ko, Fu-Hsiang; Chao, Tien-Sheng; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:32Z |
High-kappa material sidewall with source/drain-to-gate non-overlapped structure for low standby power applications
|
Ma, Ming-Wen; Chao, Tien-Sheng; Kao, Kuo-Hsing; Huang, Jyun-Siang; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:31Z |
Plasma damage-enhanced negative bias temperature instability in low-temperature polycrystalline silicon thin-film transistors
|
Chen, Chih-Yang; Lee, Jam-Wem; Chen, Wei-g Chen; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Lee, Po-Hao; Wang, Shen-De; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:12Z |
Sol-gel-derived double-layered nanocrystal memory
|
Ko, Fu-Hsiang; You, Hsin-Chiang; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:11Z |
Nitrogen effects on the integrity of silicon dioxide grown on polycrystalline silicon
|
Lai, Chao Sung; Kao, Chyuan Haur; Lee, Chung Len; Lei, Tan Fu |
| 國立交通大學 |
2014-12-08T15:15:11Z |
Si nanocrystal memory devices self-assembled by in situ rapid thermal annealing of ultrathin a-Si on SiO2
|
Chen, Jian-Hao; Lei, Tan-Fu; Landheer, Dolf; Wu, Xiaohua; Liu, Jian; Chao, Tien-Sheng |
| 國立交通大學 |
2014-12-08T15:15:10Z |
Plasma-induced damage on the performance and reliability of low-temperature polycrystalline silicon thin-film transistors
|
Chen, Chih-Yang; Wang, Shen-De; Shieh, Ming-Shan; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Lee, Jam-Wem; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:07Z |
Characteristics of Pr2O3 gate dielectric thin-film transistors fabricated on fluorine-ion-implanted polysilicon films
|
Chang, Chia-Wen; Deng, Chih-Kang; Huang, Jiun-Jia; Chang, Hong-Ren; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:06Z |
Two-bit lanthanum oxide trapping layer nonvolatile flash memory
|
Lin, Yu-Hsien; Chien, Chao-Hsin; Yang, Tsung-Yuan; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:06Z |
Bias temperature instabilities for low-temperature polycrystalline silicon complementary thin-film transistors
|
Chen, Chih-Yang; Lee, Jam-Wem; Ma, Ming-Wen; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Wang, Shen-De; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:05Z |
Fabrication of SONOS-type flash memory with the binary high-k dielectrics by the sol-gel spin coating method
|
Ko, Fu-Hsiang; You, Hsin-Chiang; Chang, Chun-Ming; Yang, Wen-Luh; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:15:03Z |
Performance improvement of CoTiO3 high-k dielectrics with nitrogen incorporation
|
Chen, Jian Hao; Huang, Tzung Bin; Wu, Xiaohua; Landheer, Dolf; Lei, Tan Fu; Chao, Tien Sheng |
| 國立交通大學 |
2014-12-08T15:14:34Z |
Impact of high-k offset spacer in 65-nm node SOI devices
|
Ma, Ming-Wen; Wu, Chien-Hung; Yang, Tsung-Yu; Kao, Kuo-Hsing; Wu, Woei-Cherng; Wang, Shui-Jinn; Chao, Tien-Sheng; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:14:31Z |
Low-temperature polycrystalline silicon thin-film flash memory with hafnium silicate
|
Lin, Yu-Hsien; Chien, Chao-Hsin; Chou, Tung-Huan; Chao, Tien-Sheng; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:14:26Z |
Impact of channel dangling bonds on reliability characteristics of flash memory on poly-Si thin films
|
Lin, Yu-Hsien; Chien, Chao-Hsin; Chou, Tung-Huan; Chao, Tien-Sheng; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:14:11Z |
A reliability model for low-temperature polycrystalline silicon thin-film transistors
|
Chen, Chih-Yang; Lee, Jam-Wem; Lee, Po-Hao; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Ma, Ming-Wen; Wang, Shen-De; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:14:07Z |
Characteristics of self-aligned Si/Ge T-gate poly-Si thin-film transistors with high ON/OFF current ratio
|
Kuo, Po-Yi; Chao, Tien-Sheng; Hsieh, Pei-Shan; Lei, Tan-Fu |
| 國立交通大學 |
2014-12-08T15:13:52Z |
Nonvolatile flash memory devices using CeO2 nanocrystal trapping layer for two-bit per cell applications
|
Yang, Shao-Ming; Chien, Chao-Hsin; Huang, Jiun-Jia; Lei, Tan-Fu |
