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Showing items 116-125 of 214  (22 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2014-12-08T15:06:12Z SELECTIVE EPITAXY ON SILICON BY ATMOSPHERIC-PRESSURE SIH4-HCL CVD HSIEH, TP; LEE, CL; LEI, TF
國立交通大學 2014-12-08T15:06:11Z A VERTICAL KELVIN TEST STRUCTURE FOR MEASURING THE TRUE SPECIFIC CONTACT RESISTIVITY LEI, TF; LEU, LY; LEE, CL
國立交通大學 2014-12-08T15:06:03Z ELLIPSOMETRY MEASUREMENTS ON SIO2-FILMS FOR THICKNESSES UNDER 200-A HO, JH; LEE, CL; JEN, CW; LEI, TF
國立交通大學 2014-12-08T15:06:01Z THE PD-ZN SYSTEM FOR OHMIC CONTACTS TO P-TYPE GAP LEI, TF; JENG, GK
國立交通大學 2014-12-08T15:06:00Z THE SPREADING RESISTANCE ERROR IN THE VERTICAL KELVIN TEST RESISTOR STRUCTURE FOR THE SPECIFIC CONTACT RESISTIVITY LEE, CL; YANG, WL; LEI, TF
國立交通大學 2014-12-08T15:05:57Z ERROR REDUCTION IN THE ELLIPSOMETRIC MEASUREMENT ON THIN-FILMS HO, JH; LEE, CL; LEI, TF
國立交通大學 2014-12-08T15:05:53Z TANTALUM SILICIDE SCHOTTKY CONTACTS TO GAAS LEE, CP; LIU, TH; LEI, TF; WU, SC
國立交通大學 2014-12-08T15:05:52Z SWITCHING CHARACTERISTICS OF MINPN DEVICES CHANG, DCY; LEE, CL; LEI, TF
國立交通大學 2014-12-08T15:05:51Z AN MINPIM STRUCTURE MIXING DEVICE CHANG, DCY; LEE, CL; LEI, TF
國立交通大學 2014-12-08T15:05:48Z A SWITCHING DEVICE OF A PN JUNCTION STRUCTURE WITH 2 LAYERS OF THIN OXIDE CHANG, DCY; LEE, CL; LEI, TF

Showing items 116-125 of 214  (22 Page(s) Totally)
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