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"lei tf"的相關文件
顯示項目 206-214 / 214 (共22頁)
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| 國立交通大學 |
2014-12-08T15:01:56Z |
Suppression of boron penetration in P+-poly-Si gate metal-oxide-semiconductor transistor using nitrogen implantation
|
Chao, TS; Chien, CH; Hao, CP; Liaw, MC; Chu, CH; Chang, CY; Lei, TF; Sun, WT; Hsu, CH |
| 國立交通大學 |
2014-12-08T15:01:54Z |
MOS magnetic current sensor based on standard CMOS process
|
Yang, HM; Lei, TF; Huang, YC; Lee, CL |
| 國立交通大學 |
2014-12-08T15:01:44Z |
Hydrogen and oxygen plasma effects on polycrystalline silicon thin films of various thicknesses
|
Liou, BW; Lee, CL; Lei, TF; Wu, YH |
| 國立交通大學 |
2014-12-08T15:01:42Z |
Suppression of boron penetration by using inductive-coupling-nitrogen-plasma in stacked amorphous/polysilicon gate structure
|
Yang, WL; Lin, CJ; Chao, TS; Liu, DG; Lei, TF |
| 國立交通大學 |
2014-12-08T15:01:39Z |
Plasma charging damage and water-related hot-carrier reliability in the deposition of plasma-enhanced tetraethylorthosilicate oxide
|
Lin, YM; Jang, SM; Yu, CH; Lei, TF; Chen, JY |
| 國立交通大學 |
2014-12-08T15:01:35Z |
The characteristics of polysilicon oxide grown on amorphous silicon deposited from disilane
|
Lin, YM; Lei, TF |
| 國立交通大學 |
2014-12-08T15:01:34Z |
Improvement of water-related hot-carrier reliability by optimizing the plasma-enhanced tetra-ethoxysilane deposition process
|
Lin, YM; Jang, SM; Yu, CH; Lei, TF |
| 國立交通大學 |
2014-12-08T15:01:30Z |
Monitoring trapped charge generation for gate oxide under stress
|
Lin, YH; Lee, CL; Lei, TF |
| 國立交通大學 |
2014-12-08T15:01:07Z |
Suppression of boron penetration in p(+) polysilicon gate using Si-B diffusion source
|
Chao, TS; Kuo, CP; Lei, TF; Chen, TP; Huang, TY; Chang, CY |
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