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總筆數 :2856708
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53582912
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744
教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
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"lei tf"的相關文件
顯示項目 136-145 / 214 (共22頁)
<< < 9 10 11 12 13 14 15 16 17 18 > >>
每頁顯示[10|25|50]項目
| 國立交通大學 |
2014-12-08T15:04:52Z |
POLY-OXIDE POLY-SI/SIO2/SI STRUCTURE FOR ELLIPSOMETRY MEASUREMENT
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CHAO, TS; LEE, CL; LEI, TF; YEN, YT |
| 國立交通大學 |
2014-12-08T15:04:50Z |
INVESTIGATION ON THE INTERFACE OF THE POLYCRYSTALLINE SILICON CONTACTED DIODE FORMED WITH A STACKED AMORPHOUS-SILICON FILM
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WU, SL; LEE, CL; LEI, TF; LEE, TL; CHEN, LJ |
| 國立交通大學 |
2014-12-08T15:04:48Z |
CHARACTERIZATION OF ULTRATHIN OXIDE PREPARED BY LOW-TEMPERATURE WAFER LOADING AND NITROGEN PREANNEALING BEFORE OXIDATION
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WU, SL; LEE, CL; LEI, TF; LIANG, MS |
| 國立交通大學 |
2014-12-08T15:04:45Z |
A STUDY OF THE INTERFACIAL LAYER OF AL AND AL(1-PERCENT SI)-SI CONTACTS USING A ZERO-LAYER ELLIPSOMETRY MODEL
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CHAO, TS; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:04:42Z |
THE IMPACT OF TITANIUM SILICIDE ON THE CONTACT RESISTANCE FOR SHALLOW JUNCTION FORMED BY OUT-DIFFUSION OF ARSENIC FROM POLYSILICON
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YANG, WL; LEI, TF; HUANG, CT; LEE, CL |
| 國立交通大學 |
2014-12-08T15:04:37Z |
H-2/O-2 PLASMA ON POLYSILICON THIN-FILM TRANSISTOR
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CHERN, HN; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:04:37Z |
ELECTRICAL CHARACTERISTICS OF TEXTURED POLYSILICON OXIDE PREPARED BY A LOW-TEMPERATURE WAFER LOADING AND N-2 PREANNEALING PROCESS
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WU, SL; LIN, TY; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:04:31Z |
THE REFRACTIVE-INDEX OF INP AND ITS OXIDE MEASURED BY MULTIPLE-ANGLE INCIDENT ELLIPSOMETRY
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CHAO, TS; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:04:29Z |
ULTRATHIN TEXTURED POLYCRYSTALLINE OXIDE WITH A HIGH ELECTRON CONDUCTION EFFICIENCY PREPARED BY THERMAL-OXIDATION OF THIN POLYCRYSTALLINE SILICON FILM ON N+ POLYCRYSTALLINE SILICON
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WU, SL; LEE, CL; LEI, TF |
| 國立交通大學 |
2014-12-08T15:04:29Z |
THICKNESS DETERMINATION OF POLY-SI/POLY-OXIDE POLY-SI/SIO2/SI STRUCTURE BY ELLIPSOMETER
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CHAO, TS; LEE, CL; LEI, TF |
顯示項目 136-145 / 214 (共22頁)
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